Debuncher Profile Monitor Evaluation
Description:
The original microchannel plates have been damaged in the beam region. After an attempt to revive the plates by baking, the gain of the central 30mm is still reduced by approximately a factor of three. The plates appear to have been irreversibly damaged by being operated for an extended period of time at high gain with high debuncher beam currents. A new set of microchannel plates has been installed in the monitor. Because of a production error, the gap between the microchannel plate output and…
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Date:
January 13, 1986
Creator:
Krider, J.