Debuncher Profile Monitor Evaluation

PDF Version Also Available for Download.

Description

The original microchannel plates have been damaged in the beam region. After an attempt to revive the plates by baking, the gain of the central 30mm is still reduced by approximately a factor of three. The plates appear to have been irreversibly damaged by being operated for an extended period of time at high gain with high debuncher beam currents. A new set of microchannel plates has been installed in the monitor. Because of a production error, the gap between the microchannel plate output and the anode wire plane was set at 15mm instead of 3mm. The high voltage divider ... continued below

Creation Information

Krider, J. January 13, 1986.

Context

This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this report can be viewed below.

Who

People and organizations associated with either the creation of this report or its content.

Author

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this report. Follow the links below to find similar items on the Digital Library.

Description

The original microchannel plates have been damaged in the beam region. After an attempt to revive the plates by baking, the gain of the central 30mm is still reduced by approximately a factor of three. The plates appear to have been irreversibly damaged by being operated for an extended period of time at high gain with high debuncher beam currents. A new set of microchannel plates has been installed in the monitor. Because of a production error, the gap between the microchannel plate output and the anode wire plane was set at 15mm instead of 3mm. The high voltage divider allowed a maximum of 170 volts to be applied across this gap. Under the conditions at which the Monitor was being operated, the distribution of collected electrons from a single micro channel was spread over a large area. A collimated UV light source which had a FWHM of 3mm produced a profile with a FWHM of 22mm with an amplifier threshold supply voltage of 1.0 V and FWHM of 9mm with a threshold voltage of 5.0V. See Figure 1. When new microchannel plates were installed, the anode gap was reduced to 9.5mm, and the gap voltage was increased to 760V, the results shown in Figure 2 were obtained. The width of the distribution depends strongly on the plate gain and discriminator threshold. Analog readout with a SWIC scanner eliminates the dependence of width on plate gain. Figure 3 shows two scanner profiles with plate gains differing by a factor of 64. The anode wire plane allows a significant fraction of the charge to leak through into the low field region behind the plane and spread over several wires before being captured by the wires. This produces broad tails on the width distribution. Replacing the wire plane with strip electrodes etched on a printed circuit board eliminates this problem, as shown in Figure 4. Figure 5 shows scanner profiles with wire anodes and with P.C. strip anodes. The intrinsic resolution of the detector appears to be less than one element width (2.2mm), so the P.C. anode will have 8 elements instead of the previous 32. This will provide more useful information in measuring 1/2 {pi} beams from the booster.

Language

Item Type

Identifier

Unique identifying numbers for this report in the Digital Library or other systems.

  • Report No.: FERMILAB-PBAR-NOTE-444
  • Grant Number: AC02-07CH11359
  • DOI: 10.2172/948900 | External Link
  • Office of Scientific & Technical Information Report Number: 948900
  • Archival Resource Key: ark:/67531/metadc929065

Collections

This report is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this report?

When

Dates and time periods associated with this report.

Creation Date

  • January 13, 1986

Added to The UNT Digital Library

  • Nov. 13, 2016, 7:26 p.m.

Description Last Updated

  • Dec. 7, 2016, 10:25 a.m.

Usage Statistics

When was this report last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 1

Interact With This Report

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Krider, J. Debuncher Profile Monitor Evaluation, report, January 13, 1986; Batavia, Illinois. (digital.library.unt.edu/ark:/67531/metadc929065/: accessed July 18, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.