Trace Characterization: Chemical and Physical
Description:
From Introduction: "This symposium focuses attention on the growing awareness of the necessity for developing and using better methods for characterizing solids. Many of the most interesting properties of solids depend directly upon these small concentrations of impurities and defects, and the illustration of this is a principal theme of this paper."
Date:
April 28, 1967
Creator:
Meinke, W. Wayne & Scribner, Bourdon F.
Item Type:
Refine your search to only
Report