Recent Advances in AC-DC Transfer Measurements Using Thin-Film Thermal Converters

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Description

New standards for ac current and voltage measurements, thin-film multifunction thermal converters (MJTCS), have been fabricated using thin-film and micro-electro-mechanical systems (MEMS) technology. Improved sensitivity and accuracy over single-junction thermoelements and targeted performance will allow new measurement approaches in traditionally troublesome areas such as the low frequency and high current regimes. A review is presented of new microfabrication techniques and packaging methods that have resulted from a collaborative effort at Sandia National Laboratories and the National Institute of Standards and Technology (MHZ).

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11 p.

Creation Information

Wunsch, Thomas F.; Kinard, Joseph R.; Manginell, Ronald P.; Lipe, Thomas E.; Solomon, Otis M., Jr. & Jungling, Kenneth C. December 8, 2000.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by the UNT Libraries Government Documents Department to the UNT Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 63 times. More information about this article can be viewed below.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM, and Livermore, CA (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

New standards for ac current and voltage measurements, thin-film multifunction thermal converters (MJTCS), have been fabricated using thin-film and micro-electro-mechanical systems (MEMS) technology. Improved sensitivity and accuracy over single-junction thermoelements and targeted performance will allow new measurement approaches in traditionally troublesome areas such as the low frequency and high current regimes. A review is presented of new microfabrication techniques and packaging methods that have resulted from a collaborative effort at Sandia National Laboratories and the National Institute of Standards and Technology (MHZ).

Physical Description

11 p.

Notes

OSTI as DE00771534

Medium: P; Size: 11 pages

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  • Measurement Science Conference 2001, Anaheim, CA (US), 01/18/2001--01/21/2001

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  • Report No.: SAND2000-3059C
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 771534
  • Archival Resource Key: ark:/67531/metadc717951

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  • December 8, 2000

Added to The UNT Digital Library

  • Sept. 29, 2015, 5:31 a.m.

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  • June 17, 2020, 1:41 p.m.

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Wunsch, Thomas F.; Kinard, Joseph R.; Manginell, Ronald P.; Lipe, Thomas E.; Solomon, Otis M., Jr. & Jungling, Kenneth C. Recent Advances in AC-DC Transfer Measurements Using Thin-Film Thermal Converters, article, December 8, 2000; Albuquerque, New Mexico. (https://digital.library.unt.edu/ark:/67531/metadc717951/: accessed May 14, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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