Angle-resolved photoemission extended fine structure: Multiple layers of emitters and multiple initial states

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Recently, angle-resolved photoemission extended fine structure (ARPEFS) has been applied to experimental systems involving multiple layers of emitters and non-s core-level photoemission in an effort to broaden the utility of the technique. Most of the previous systems have been comprised of atomic or molecular overlayers adsorbed onto a single-crystal, metal surface and the photoemission data were taken from an s atomic core-level in the overlayer. For such a system, the acquired ARPEFS data is dominated by the p{sub o} final state wave backscattering from the substrate atoms and is well understood. In this study, we investigate ARPEFS as a surface-region … continued below

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4 pages

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Huff, W.R.A.; Kellar, S.A.; Moler, E.J.; Chen, Y.; Wu, H.; Shirley, D.A. et al. August 1, 1995.

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Recently, angle-resolved photoemission extended fine structure (ARPEFS) has been applied to experimental systems involving multiple layers of emitters and non-s core-level photoemission in an effort to broaden the utility of the technique. Most of the previous systems have been comprised of atomic or molecular overlayers adsorbed onto a single-crystal, metal surface and the photoemission data were taken from an s atomic core-level in the overlayer. For such a system, the acquired ARPEFS data is dominated by the p{sub o} final state wave backscattering from the substrate atoms and is well understood. In this study, we investigate ARPEFS as a surface-region structure determination technique when applied to experimental systems comprised of multiple layers of photoemitters and arbitrary initial state core-level photoemission. Understanding the data acquired from multiple layers of photoemitters is useful for studying multilayer interfaces, ''buried'' surfaces, and clean crystals in ultra- high vacuum. The ability to apply ARPEFS to arbitrary initial state core-level photoemission obviously opens up many systems to analysis. Efforts have been ongoing to understand such data in depth. We present clean Cu(111) 3s, 3p, and 3d core-level, normal photoemission data taken on a high resolution soft x-ray beamline 9.3.2 at the Advanced Light Source in Berkeley, California and clean Ni(111) 3p normal photoemission data taken at the National Synchrotron Light Source in Upton, New York, USA.

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4 pages

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INIS; OSTI as DE00114033

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  • 11. international conference on vacuum ultraviolet radiation physics, Tokyo (JP), 08/27/1995--09/01/1995; Other Information: Supercedes report DE96001119; PBD: Aug 1995

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  • Other: DE96001119
  • Report No.: LBL--37640
  • Report No.: LSBL-276
  • Report No.: CONF-950859-2
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 114033
  • Archival Resource Key: ark:/67531/metadc624745

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  • August 1, 1995

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  • June 16, 2015, 7:43 a.m.

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Huff, W.R.A.; Kellar, S.A.; Moler, E.J.; Chen, Y.; Wu, H.; Shirley, D.A. et al. Angle-resolved photoemission extended fine structure: Multiple layers of emitters and multiple initial states, article, August 1, 1995; California. (https://digital.library.unt.edu/ark:/67531/metadc624745/: accessed July 16, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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