Angle-resolved photoemission extended fine structure: Multiple layers of emitters and multiple initial states

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Recently, angle-resolved photoemission extended fine structure (ARPEFS) has been applied to experimental systems involving multiple layers of emitters and non-s core-level photoemission in an effort to broaden the utility of the technique. Most of the previous systems have been comprised of atomic or molecular overlayers adsorbed onto a single-crystal, metal surface and the photoemission data were taken from an s atomic core-level in the overlayer. For such a system, the acquired ARPEFS data is dominated by the p{sub o} final state wave backscattering from the substrate atoms and is well understood. In this study, we investigate ARPEFS as a surface-region ... continued below

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4 pages

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Huff, W.R.A.; Kellar, S.A.; Moler, E.J.; Chen, Y.; Wu, H.; Shirley, D.A. et al. August 1, 1995.

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Description

Recently, angle-resolved photoemission extended fine structure (ARPEFS) has been applied to experimental systems involving multiple layers of emitters and non-s core-level photoemission in an effort to broaden the utility of the technique. Most of the previous systems have been comprised of atomic or molecular overlayers adsorbed onto a single-crystal, metal surface and the photoemission data were taken from an s atomic core-level in the overlayer. For such a system, the acquired ARPEFS data is dominated by the p{sub o} final state wave backscattering from the substrate atoms and is well understood. In this study, we investigate ARPEFS as a surface-region structure determination technique when applied to experimental systems comprised of multiple layers of photoemitters and arbitrary initial state core-level photoemission. Understanding the data acquired from multiple layers of photoemitters is useful for studying multilayer interfaces, ''buried'' surfaces, and clean crystals in ultra- high vacuum. The ability to apply ARPEFS to arbitrary initial state core-level photoemission obviously opens up many systems to analysis. Efforts have been ongoing to understand such data in depth. We present clean Cu(111) 3s, 3p, and 3d core-level, normal photoemission data taken on a high resolution soft x-ray beamline 9.3.2 at the Advanced Light Source in Berkeley, California and clean Ni(111) 3p normal photoemission data taken at the National Synchrotron Light Source in Upton, New York, USA.

Physical Description

4 pages

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INIS; OSTI as DE00114033

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  • 11. international conference on vacuum ultraviolet radiation physics, Tokyo (JP), 08/27/1995--09/01/1995; Other Information: Supercedes report DE96001119; PBD: Aug 1995

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  • Other: DE96001119
  • Report No.: LBL--37640
  • Report No.: LSBL-276
  • Report No.: CONF-950859-2
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 114033
  • Archival Resource Key: ark:/67531/metadc624745

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  • August 1, 1995

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  • June 16, 2015, 7:43 a.m.

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  • April 4, 2016, 9:02 p.m.

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Huff, W.R.A.; Kellar, S.A.; Moler, E.J.; Chen, Y.; Wu, H.; Shirley, D.A. et al. Angle-resolved photoemission extended fine structure: Multiple layers of emitters and multiple initial states, article, August 1, 1995; California. (digital.library.unt.edu/ark:/67531/metadc624745/: accessed August 17, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.