Confidence in the precisions of AMS and decay measurements must be comparable for the application of the {sup 14}C calibration to age determinations using both technologies. We confirmed the random nature of the temporal distribution of {sup 14}C ions in an AMS spectrometer for a number of sample counting rates and properties of the sputtering process. The temporal distribution of ion counts was also measured to confirm the applicability of traditional counting statistics.
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Confidence in the precisions of AMS and decay measurements must be comparable for the application of the {sup 14}C calibration to age determinations using both technologies. We confirmed the random nature of the temporal distribution of {sup 14}C ions in an AMS spectrometer for a number of sample counting rates and properties of the sputtering process. The temporal distribution of ion counts was also measured to confirm the applicability of traditional counting statistics.
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Vogel, J S; Ognibene, T; Palmblad, M & Reimer, P.Counting Statistics and Ion Interval Density in AMS,
article,
August 3, 2004;
Livermore, California.
(https://digital.library.unt.edu/ark:/67531/metadc1413913/:
accessed May 15, 2024),
University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu;
crediting UNT Libraries Government Documents Department.