Solute effect on the creep resistance of two-phase lamellar TiAl with an ultrafine microstructure creep-deformed in a low-stress (LS) creep regime [where a linear creep behavior was observed] has been investigated. The resulted deformation substructure and in-situ TEM experiment revealed that interface sliding by the motion of pre-existing interfacial dislocations is the predominant deformation mechanism in LS creep regime. Solute segregation at lamellar interfaces and interfacial precipitation caused by the solute segregation result in a beneficial effect on the creep resistance of ultrafine lamellar TiAl in LS creep regime.
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Lawrence Livermore National Lab., CA (United States)
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California
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Solute effect on the creep resistance of two-phase lamellar TiAl with an ultrafine microstructure creep-deformed in a low-stress (LS) creep regime [where a linear creep behavior was observed] has been investigated. The resulted deformation substructure and in-situ TEM experiment revealed that interface sliding by the motion of pre-existing interfacial dislocations is the predominant deformation mechanism in LS creep regime. Solute segregation at lamellar interfaces and interfacial precipitation caused by the solute segregation result in a beneficial effect on the creep resistance of ultrafine lamellar TiAl in LS creep regime.
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Hsiung, L M.Interfacial Control of Creep Deformation in Ultrafine Lamellar TiAl,
article,
November 26, 2002;
California.
(https://digital.library.unt.edu/ark:/67531/metadc1408372/:
accessed May 16, 2024),
University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu;
crediting UNT Libraries Government Documents Department.