Internal boundary layer capacitors were characterized by scanning transmission electron microscopy and by microscale electrical measurements. Data are given for the chemical and physical characteristics of the individual grains and boundaries, and their associated electric and dielectric properties. Segregated internal boundary layers were identified with resistivities of 10/sup 12/-10/sup 13/ ..cap omega..-cm. Bulk apparent dielectric constants were 10,000-60,000. A model is proposed to explain the dielectric behavior in terms of an equivalent n-c-i-c-n representation of ceramic microstructure, which is substantiated by capacitance-voltage analysis.
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Internal boundary layer capacitors were characterized by scanning transmission electron microscopy and by microscale electrical measurements. Data are given for the chemical and physical characteristics of the individual grains and boundaries, and their associated electric and dielectric properties. Segregated internal boundary layers were identified with resistivities of 10/sup 12/-10/sup 13/ ..cap omega..-cm. Bulk apparent dielectric constants were 10,000-60,000. A model is proposed to explain the dielectric behavior in terms of an equivalent n-c-i-c-n representation of ceramic microstructure, which is substantiated by capacitance-voltage analysis.
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Park, H. D. & Payne, D. A.Characterization of internal boundary layer capacitors,
article,
May 1, 1980;
Urbana, Illinois.
(https://digital.library.unt.edu/ark:/67531/metadc1059835/:
accessed July 16, 2024),
University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu;
crediting UNT Libraries Government Documents Department.
