Thermal Reliability Study of Bypass Diodes in Photovoltaic Modules (Poster)

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This paper presents the result of high-temperature durability and thermal cycling testing and analysis for the selected diodes to study the detail of the thermal design and relative long-term reliability of the bypass diodes used to limit the detrimental effects of module hot-spot susceptibility.

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Zhang, Z.; Wohlgemuth, J. & Kurtz, S. May 1, 2013.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by the UNT Libraries Government Documents Department to the UNT Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 162 times. More information about this article can be viewed below.

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Description

This paper presents the result of high-temperature durability and thermal cycling testing and analysis for the selected diodes to study the detail of the thermal design and relative long-term reliability of the bypass diodes used to limit the detrimental effects of module hot-spot susceptibility.

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1 pg.

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  • Presented at the 2013 Photovoltaic Module Reliability Workshop, 26-27 February 2013, Golden, Colorado; Related Information: NREL (National Renewable Energy Laboratory)

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  • Report No.: NREL/PO-5200-58225
  • Grant Number: AC36-08GO28308
  • Office of Scientific & Technical Information Report Number: 1079736
  • Archival Resource Key: ark:/67531/metadc838942

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  • May 1, 2013

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  • May 19, 2016, 9:45 a.m.

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  • June 15, 2016, 3:50 p.m.

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Zhang, Z.; Wohlgemuth, J. & Kurtz, S. Thermal Reliability Study of Bypass Diodes in Photovoltaic Modules (Poster), article, May 1, 2013; Golden, Colorado. (https://digital.library.unt.edu/ark:/67531/metadc838942/: accessed July 15, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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