Determination of interface structure and bonding by Z-contrast stem

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The scanning transmission electron microscope (STEM) provides a route for the determination of interface structure and bonding directly from experimental data. Through an annular detector, Z-contrast images reveal atomic column locations without prior knowledge. The incoherent nature of such images allows a direct structure inversion through a maximum entropy analysis. The Z-contrast image also facilitates atomic-resolution spectroscopy by allowing the probe to be positioned with atomic precision. With this combination of atomic-resolution imaging and spectroscopy, structural units for [001] tilt grain boundaries in SrTiO{sub 3} were identified. All units revealed the presence of half-filled columns, an efficient way to overcome … continued below

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11 p.

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Pennycook, S. J.; Browning, N. D.; McGibbon, M. M.; McGibbon, A. J.; Chisholm, M. F. & Jesson, D. E. June 1, 1995.

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Description

The scanning transmission electron microscope (STEM) provides a route for the determination of interface structure and bonding directly from experimental data. Through an annular detector, Z-contrast images reveal atomic column locations without prior knowledge. The incoherent nature of such images allows a direct structure inversion through a maximum entropy analysis. The Z-contrast image also facilitates atomic-resolution spectroscopy by allowing the probe to be positioned with atomic precision. With this combination of atomic-resolution imaging and spectroscopy, structural units for [001] tilt grain boundaries in SrTiO{sub 3} were identified. All units revealed the presence of half-filled columns, an efficient way to overcome the problem of like-ion repulsion in ionic materials. With the 1.3 {angstrom} probe of the 300-kV STEM, an unexpected core structure has been found for Lomer dislocations at a CdTe/ GaAs [001] interface, while 60{degrees} dislocations were directly identified to be of glide type.

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11 p.

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OSTI as DE96003035

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  • Gettering and defect engineering in semiconductor technology, Wulkow (Germany), 2-7 Sep 1995

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  • Other: DE96003035
  • Report No.: CONF-9509267--1
  • Grant Number: AC05-84OR21400
  • Office of Scientific & Technical Information Report Number: 164915
  • Archival Resource Key: ark:/67531/metadc621213

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  • June 1, 1995

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  • June 16, 2015, 7:43 a.m.

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  • Dec. 17, 2020, 5:36 p.m.

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Pennycook, S. J.; Browning, N. D.; McGibbon, M. M.; McGibbon, A. J.; Chisholm, M. F. & Jesson, D. E. Determination of interface structure and bonding by Z-contrast stem, article, June 1, 1995; Tennessee. (https://digital.library.unt.edu/ark:/67531/metadc621213/: accessed July 16, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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