This paper briefly reviews sources of noise in Josephson junctions, and the limits they impose on the sensitivity of dc and rf SQUIDS. The results are strictly valid only for a resistively shunted junction (RSJ) with zero capacitance, but should be applicable to point contact junctions and microbridges in so far as these devices can be approximated by the RSJ model. Fluctuations arising from Nyquist noise in the resistive shunt of a single junction are discussed in the limit eI/sub o/R/k/sub B/T << 1 in which a classical treatment is appropriate, and then extend the treatment to the limit eI/sub …
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California Univ., Berkeley (USA). Lawrence Berkeley Lab.
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Berkeley, California
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This paper briefly reviews sources of noise in Josephson junctions, and the limits they impose on the sensitivity of dc and rf SQUIDS. The results are strictly valid only for a resistively shunted junction (RSJ) with zero capacitance, but should be applicable to point contact junctions and microbridges in so far as these devices can be approximated by the RSJ model. Fluctuations arising from Nyquist noise in the resistive shunt of a single junction are discussed in the limit eI/sub o/R/k/sub B/T << 1 in which a classical treatment is appropriate, and then extend the treatment to the limit eI/sub o/R/k/sub B/T greater than or equal to 1 in which quantum effects become important. The Nyquist limit theory is used to calculate the noise in a dc SQUID, and the results are compared with a number of practical devices. The quantum limit is briefly considered. Results for the predicted sensitivity of rf SQUIDS are presented, and also compared with a number of practical devices. Finally, the importance of l/f noise (f is the frequency) in limiting the low frequency performance of SQUIDS is discussed.
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