Chemical Depth Profiling from Neutron Reflectometry
Description:
The material profile of a thin film can be analyzed by placing the film on a substrate and by sending a neutron beam onto it at various angles of incidence. Technically, the scattering length density of the film needs to be determined as a function of depth. A reflectometer is used to measure the amount of reflection (reflectivity) as a function of the angle of incidence. Mathematically, this is equivalent to sending the neutron beam onto the film at every energy but at a fixed angle of inciden…
more
Date:
March 21, 2006
Creator:
Aktosun, Tuncay
Item Type:
Refine your search to only
Report
Partner:
UNT Libraries Government Documents Department