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Broadband measurements of electron cyclotron emission in TFTR (Tokamak Fusion Test Reactor) using a quasi-optical light collection system and a polarizing Michelson interferometer

Description: For the past three years, a Fourier transform spectrometer diagnostic system, employing a fast-scanning polarizing Michelson interferometer, has been operating on the TFTR tokamak at Princeton Plasma Physics Laboratory. It is used to measure the electron cyclotron emission spectrum over the range 2.5 to 18 cm/sup /minus/1/ (75-540 GHz) with a resolution of 0.123 cm/sup /minus/1/(3.7 GHz), at a rate of 72 spectra per second. The quasi-optical system for collecting the light and transporting it t… more
Date: April 1, 1988
Creator: Stauffer, F. J.; Boyd, D. A.; Cutler, R. C.; Diesso, M.; McCarthy, M. P.; Montague, J. et al.
Partner: UNT Libraries Government Documents Department
open access

VISAR: interferometer quadrature signal recording by electronic streak camera

Description: This short paper describes a demonstration to record the four quadrature signals from a push-pull VISAR velocity interferometer using an electronic streak camera. Optical fibers were used to transmit the interferometer outputs to the camera photocathode. Brightness variations of these signals were recorded on film during the experiment. Velocity information was later recovered from this record to give a continuous velocity history. Anticipated advantages over previous methods are increased time… more
Date: January 1, 1985
Creator: Hemsing, W.F.
Partner: UNT Libraries Government Documents Department
open access

Measurements of optically thin electron cyclotron emission from relativistic electrons

Description: Electron cyclotron emission (ECE) from hot, relativistic electrons has been measured simulataneously at several optically thin frequencies (f/f/sub ce/ = 4.6, 7.0, and 9.6) on the Tandem Mirror Experiment-Upgrade. A method to determine the temporal evolution of the hot electron density, n/sub h/, and temperature T/sub h/ is discussed. Calculations of T/sub h/ agree with the analysis of the high energy x-ray spectra. Heating rates vary between 3 keV/ms and 13 keV/ms and temperatures over 300 keV… more
Date: October 1, 1987
Creator: James, R. A.; Silver, E.; Boyd, D.; Ellis, R. F.; Jantz, S.; Lasnier, C. J. et al.
Partner: UNT Libraries Government Documents Department
open access

Investigation of nonradiative recombination in semiconductors by photothermal displacement spectroscopy

Description: The dynamics of nonradiative recombination processes are investigated by measuring the thermal expansion and subsequent displacement of a sample surface caused by the absorption of a modulated laser beam. 6 refs., 3 figs.
Date: June 1, 1985
Creator: Dersch, H. & Amer, N.M.
Partner: UNT Libraries Government Documents Department
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