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Development of a high-throughput microfluidic integrated microarray for the detection of chimeric bioweapons.

Description: The advancement of DNA cloning has significantly augmented the potential threat of a focused bioweapon assault, such as a terrorist attack. With current DNA cloning techniques, toxin genes from the most dangerous (but environmentally labile) bacterial or viral organism can now be selected and inserted into robust organism to produce an infinite number of deadly chimeric bioweapons. In order to neutralize such a threat, accurate detection of the expressed toxin genes, rather than classification … more
Date: October 1, 2006
Creator: Sheppod, Timothy; Satterfield, Brent; Hukari, Kyle W.; West, Jason A. A. & Hux, Gary A.
Partner: UNT Libraries Government Documents Department
open access

Nitrogen effects on crystallization kinetics of amorphous TiOxNy thin films

Description: The crystallization behavior of amorphous TiOxNy (x>>y) thin films was investigated by in-situ transmission electron microscopy. The Johnson-Mehl-Avrami-Kozolog (JMAK) theory is used to determine the Avrami exponent, activation energy, and the phase velocity pre-exponent. Addition of nitrogen inhibits diffusion, increasing the nucleation temperature, while decreasing the growth activation energy. Kinetic variables extracted from individual crystallites are compared to JMAK analysis of the… more
Date: March 30, 2001
Creator: Hukari, Kyle; Dannenberg, Rand & Stach, E.A.
Partner: UNT Libraries Government Documents Department
open access

Microstructural and conductivity comparison of Ag films grown on amorphous TiO2 and polycrystalline ZnO

Description: 8 nm thick Ag films were sputter deposited onto amorphous TiO{sub 2} underlayers 25 nm thick, and also amorphous TiO{sub 2} (25 nm)/ZnO (5 nm) multiunderlayers. The substrates were back-etched Si with a 50 nm thick LPCVD Si{sub 3}N{sub 4} electron transparent membrane. The ZnO, sputtered onto amorphous TiO{sub 2}, formed a continuous layer with a grain size of 5 nm in diameter, on the order of the film thickness. There are several microstructural differences in the Ag dependent on the underlaye… more
Date: March 26, 2001
Creator: Dannenberg, Rand; Stach, Eric; Glenn, Darin; Sieck, Peter & Hukari, Kyle
Partner: UNT Libraries Government Documents Department
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