Profiling and Mapping of Advanced Materials Using Spatially Resolved Raman Spectroscopy
Description:
We have developed a technique to profile important physical and chemical properties of materials based upon simultaneous acquisition of Raman spectra along a laser illumination line, coupled with extensive and rapid spectral analysis to extract the desired information. The technique uses a two-dimensional spectroscopic detector and, in contrast to Hadamard techniques, sample movement in one dimension that allows all collected light to be detected. Property maps comprised of the analysis results…
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Date:
August 1, 1991
Creator:
Ager, Joel; Veirs, D. K.; Lee, H. Q. & Rosenblatt, G. M.
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Partner:
UNT Libraries Government Documents Department