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Electron-Ion Time-of-Flight Coincidence Measurements of K-K Electron Capture, Cross Sections for Nitrogen, Methane, Ethylene, Ethane, Carbon Dioxide and Argon (L-K) Targets

Description: Protons with energies ranging from 0.4 to 2.0 MeV were used to measure K-shell vacancy production cross sections (oVK) for N_2, CH_4, C_2H_4, C_2H_6, and CO_2 gas targets under single collision conditions. An electron-ion time-of-flight coincidence technique was used to determind the ration of the K-K electron capture cross section, OECK, to the K-vacancy production cross section, oVK. These ratios were then combined with the measured values of oVK to extract the K-K electron capture cross sect… more
Date: May 1986
Creator: Toten, Arvel D.
Partner: UNT Libraries
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M-Shell X-Ray Production of Gold, Lead, Bismuth, Uranium for Incident Hydrogen, Helium and Fluorine Ions

Description: Incident ¹H⁺ and ⁴He⁺ ions at 0.3-2.6 MeV and ¹⁹F^q⁺ ions at 25, 27 and 35 MeV were used to study the M-shell x-ray production cross sections of Au, Pb, Bi and U. For the incident fluorine ions, projectile charge state dependence of the cross sections were extracted from measurements made with varying target thicknesses ( ~1 to ~300 μg/cm²). The efficiency of the Si(Li) detector was determined by measuring the K-shell x-ray production of various low Z elements and comparing these values to the … more
Date: December 1982
Creator: Mehta, Rahul
Partner: UNT Libraries
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