Fundamental Investigations of Nanoscale Phenomena in Beam-Assisted Nucleation, Growth and Surface Smoothing, Using in situ LEEM
Description:
The purposes for which this grant was provided were specifically (1) to construct a tandem instrument that combined a low energy electron microscope (LEEM) with an ion beam source capably of irradiating a sample during observation of the surface using LEEM; and (2) to employ the new machine to whatever degree possible to observe the evolution of clean crystal surfaces during ion beam irradiation. A principal motivation was to investigate the fundamental behavior of radiation damage under circum…
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Date:
November 5, 2008
Creator:
Flynn, Colin P.
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Partner:
UNT Libraries Government Documents Department