Vacancy related defects in thin film Pb(ZrTi)O{sub 3} materials
Description:
Positron annihilation techniques have been applied to characterize vacancy-related defects in ferroelectric thin film structures. Variable energy positron beam measurements were carried out on doped and undoped Pb(ZrTi)O{sub 3} (PZT) samples subjected to different post-deposition cool down and anneal conditions. The PZT was deposited by sol-gel with either with platinum or RuO{sub 2} electrodes, or by laser ablation with La{sub 0.5}Sr{sub 0.5}CoO{sub 3} electrodes. The RuO{sub 2} and La{sub 0.5…
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Date:
December 31, 1994
Creator:
Krishnan, A.; Keeble, D. J.; Ramesh, R.; Warren, W. L.; Tuttle, B. A.; Pfeffer, R. L. et al.
Partner:
UNT Libraries Government Documents Department