2 Matching Results

Search Results

Advanced search parameters have been applied.
in subjects: "Bypasses"  
Results: 1 - 2

Formation of ZnTe:Cu/Ti Contacts at High Temperature for CdS/CdTe Devices

Description: The conclusions of this report are that Cu diffusion from a ZnTe:Cu contact causes good and bad things. The good (Cu in CdS < low 10{sup 18} cm{sup -3})--increase in CdTe N{sub A}-N{sub D} that leads to V{sub oc} and FF improvement. The bad (Cu in CdS > low 10{sup 18} cm{sup -3})--(1) possibly decreased of shunt resistance (?); (2) depletion width in CdTe can become too narrow for optimum current collection at J{sub MPP}; (3) donor reduction in CdS (significant FF loss in LIV); and (4) ex… more
Date: May 1, 2006
Creator: Gessert, T. A.; Asher, S.; Johnston, S.; Duda, A.; Young, M. R. & Moriarty, T.
Partner: UNT Libraries Government Documents Department
Back to Top of Screen