Direct Measurement of Built-in Electrical Potential in Photovoltaic Devices by Scanning Kelvin Probe Microscopy
Description:
We report on direct measurements of the built-in electrical potential in Cu(In,Ga)Se2, GaInP2 single-junction, and GaInP2/GaAs tandem-junction solar cells, by using scanning Kelvin probe microscopy. Potential profiles on cross sections of the devices were measured quantitatively and spatially resolved in open and short circuit, under and without illuminations, with selective photon energies matching the band gaps of the junctions. The measurements provide valuable information about the electric…
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Date:
May 1, 2003
Creator:
Jiang, C. S.; Mutinho, H. R.; Hasoon, F. S.; Al-Thani, H. A.; Friedman, D. J.; Geisz, J. F. et al.
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