3D Atom Probe Tomography Study on Segregation of Yttrium in Modified Aluminum-Silicon Alloys
Description:
In this article, yttrium segregation behavior in Al-Si alloys has been studied using the three-dimensional atom probe tomography technique. Al-Si alloys were prepared by casting method, and yttrium was added to modify the eutectic silicon morphology in these alloys. The results indicated that yttrium is preferentially located within the Si phase, with the highest concentration at the interface between eutectic Al and eutectic Si.
Date:
May 15, 2018
Creator:
De-Giovanni, Mario; Alam, Talukder; Banerjee, Rajarshi & Srirangam, Prakash
Item Type:
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Partner:
UNT College of Engineering