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A. LBL-30618 Lawrence Berkeley Laboratory UNIVERSITY OF CALIFORNIA V f" " ■" 1 ' . ' Materials & Chemical Sciences Division National Center for Electron Microscopy To be presented at the Annual Meeting of the Electron Microscope Society of America-Microbeam Analysts 0 o '-c 1 i'o' K>; fl \ ' S Society, San Jose, CA, August 4-8, 1991, and to be ' ' published in the Proceedings rJUN 1 3 1991 Measurements of Ionization Cross-Sections for Electron Energy-Loss Microanalysis Under Well Defined Scattering Conditions K.M. Krishnan and C.J. Echer April 1991 i _ *K Prepared for the U.S. Department of Energy under Contract Number DE-AC03*76SF000‘J8 DISTRIBUTION OF THIS DOCUMENT IS UNLIMITED
Krishnan, K.M. & Echer, C.J.Measurements of ionization cross-section for electron energy-loss microanalysis under well defined scattering conditions,
article,
April 1, 1991;
[Berkeley,] California.
(https://digital.library.unt.edu/ark:/67531/metadc1100723/m1/1/:
accessed July 16, 2024),
University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu;
crediting UNT Libraries Government Documents Department.