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Hyper filter-fluorescer spectrometer for x rays above 120 keV

Description: An apparatus utilizing filter-fluorescer combinations is provided to measure short bursts of high fluence x-rays above 120 keV energy, where there are no practical absorption edges available for conventional filter-fluorescer techniques. The absorption edge of the prefilter is chosen to be less than that of the fluorescer, i.e., E/sub PRF/ < E/sub F/, contrary to the prior art technique E/sub PRF/ > E/sub F/. In this way, the response function is virtually zero between E/sub PRF/ and E/sub F/ a… more
Date: July 7, 1981
Creator: Wang, C. L.
Item Type: Refine your search to only Patent
Partner: UNT Libraries Government Documents Department
open access

AFM CHARACTERIZATION OF RAMAN LASER INDUCED DAMAGE ON CDZNTECRYSTAL SURFACES

Description: High quality CdZnTe (or CZT) crystals have the potential for use in room temperature gamma-ray and X-ray spectrometers. Over the last decade, the methods for growing high quality CZT have improved the quality of the produced crystals however there are material features that can influence the performance of these materials as radiation detectors. The presence of structural heterogeneities within the crystals, such as twinning, pipes, grain boundaries (polycrystallinity), and secondary phases (SP… more
Date: October 7, 2008
Creator: Teague, L. & Duff, M.
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department
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