Analysis of Bulk DKDP Damage Distribution, Obscuration and Pulse Length Dependence
Description:
Recent LLNL experiments reported elsewhere at this conference explored the pulselength dependence of 351 nm bulk damage incidence in DKDP. The results found are consistent, in part, with a model in which a distribution of small bulk initiators is assumed to exist in the crystal and the damage threshold is determined by reaching a critical temperature. The observed pulse length dependence can be explained as being set by the most probable defect capable of causing damage at a given pulselength. …
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Date:
December 15, 2000
Creator:
Feit, M D; Rubenchik, A M & Runkel, M
Item Type:
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UNT Libraries Government Documents Department