Quantitative Microanalysis with high Spatial Resolution: Application of FEG-DTEM XEDS Microanalysis to the Characterization of Complex Microstructures in Irradiated Low Alloy Steet
Description:
To assist in the characterization of microstructural changes associated with irradiation damage in low alloy steels, the technique of quantitative x-ray mapping using a field emission gun scanning transmission electron microscope (FEG-STEM) equipped with an x-ray energy Dispersive spectrometer (XEDS) has been employed. Quantitative XEDS microanalyses of the matrix and grain boundaries of irradiated specimens have been compared with previous quantitative analyses obtained using 3D-Atom Probe Fie…
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Date:
November 14, 2001
Creator:
Williams, D.B., Watanabe, M. and Burke, M.G.
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Partner:
UNT Libraries Government Documents Department