A new bend magnet beam line for scanning transmission x-ray microscopy at the Advanced Light Source
Description:
The high brightness of the bend magnets at the Advanced Light Source has been exploited to illuminate a Scanning Transmission X-ray Microscope (STXM). This is the first diffraction-limited scanning x-ray microscope to operate with useful count rate on a synchrotron bend magnet source. A simple, dedicated beam line has been built covering the range of photon energy from 250 eV to 600 eV. Ease of use and operational availability are radically improved compared to previous installations using undu…
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Date:
December 12, 2001
Creator:
Warwick, Tony; Ade, Harald; Kilcoyne, A.L. David; Kritscher, Michael; Tylisczcak, Tolek; Fakra, Sirine et al.
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UNT Libraries Government Documents Department