Description: Hundreds of target assemblies will be constructed annually for use on NIF or OMEGA in the near future. Currently, we do not have the capability to tomographically characterize the target assemblies at the desired resolution. Hence, we cannot verify if an assembly has been assembled correctly. The Engineering Directorate, through the LDRD program, is currently funding an x-ray instruments that could solve this problem. This instrument is based on a Woelter  Type-I design. We will refer to this design as the Woelter instrument in the remainder of the report. Ideally, the Woelter instrument will create images with sub-micrometer resolution. Moreover, the instrument will have a field-of-view large enough to cover an entire target assembly (up to a 2 mm square), which would eliminate the need to take multiple radiographs to get one complete target image. This report describes the optical design of the Woelter instrument.
Date: October 11, 2002
Creator: Nederbragt, W W
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