Measurement of subpicosecond electron bunch lengths
Description:
A new frequency-resolved bunch-length measuring system has been developed at the Stanford SUNSHINE facility suitable for subpicosecond electron bunches. This method utilizes a far-infrared Michelson interferometer to measure coherent transition radiation emitted from electron bunches through optical auto-correlation. A simple and systematic way has also been developed to include interference effects caused by the beam splitter, so the electron bunch length can be easily obtained from the measur…
more
Date:
November 1, 1995
Creator:
Lihn, Hung-chi; Bocek, D.; Kung, P.; Settakorn, C. & Wiedemann, H.
Item Type:
Refine your search to only
Article
Partner:
UNT Libraries Government Documents Department