Identifying electronic properties relevant to improving stability in a-Si:H-based cells and overall performance in a-Si,Ge:H-based cells. Annual subcontract report, April 18, 1994--April 17, 1995
Description:
This report describes work performed by the University of Oregon focusing on the characterization and evaluation of amorphous semiconductor materials produced by novel deposition conditions and/or methods. The results are based on a variety of junction capacitance techniques: admittance spectroscopy, transient photocapacitance (and photocurrent), and drive-level capacitance profiling. These methods allow the determination of deep defect densities and their energy distributions, Urbach bandtail …
more
Date:
November 1, 1995
Creator:
Cohen, J.D.
Item Type:
Refine your search to only
Report
Partner:
UNT Libraries Government Documents Department