Electron-Ion Time-of-Flight Coincidence Measurements of K-K Electron Capture, Cross Sections for Nitrogen, Methane, Ethylene, Ethane, Carbon Dioxide and Argon (L-K) Targets
Description:
Protons with energies ranging from 0.4 to 2.0 MeV were used to measure K-shell vacancy production cross sections (oVK) for N_2, CH_4, C_2H_4, C_2H_6, and CO_2 gas targets under single collision conditions. An electron-ion time-of-flight coincidence technique was used to determind the ration of the K-K electron capture cross section, OECK, to the K-vacancy production cross section, oVK. These ratios were then combined with the measured values of oVK to extract the K-K electron capture cross sect…
more
Date:
May 1986
Creator:
Toten, Arvel D.
Partner:
UNT Libraries