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Energy sources for the future. Proceedings of a conference held July 7--25, 1975, in Oak Ridge, Tennessee

Description: For several summers the Special Training Division of Oak Ridge Associated Universities has conducted a three-week program on Energy Sources for the Future. Sponsored by the U. S. Energy Research and Development Administration, the program is designed for college professors teaching or planning to teach energy courses. Participants have represented most branches of science. The invited lecturers have also represented most scientific disciplines. Although expert in specific fields, the speakers h… more
Date: January 1, 1975
Creator: Duggan, J. L. & Cloutier, R. J.
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Partner: UNT Libraries Government Documents Department
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Energy sources for the future

Description: The symposium program was designed for college faculty members who are teaching or plan to teach energy courses at their educational institutions. Lectures were presented on socio-economic aspects of energy development, fusion reactors, solar energy, coal-fired power plants, nuclear power, radioactive waste disposal, and radiation hazards. A separate abstract was prepared for each of 16 of the 18 papers presented; two papers were processed earlier: Residential Energy Use Alternatives to the Yea… more
Date: April 1, 1977
Creator: Duggan, J. L. & Cloutier, R. J.
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Partner: UNT Libraries Government Documents Department
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K-shell x-ray production cross sections of selected elements Al to Ni for 4. 0 to 38. 0 MeV /sup 10/B ions. [Cross sections, 4. 0 to 38 MeV, binding energy, electron capture decay, PWBA, energy shifts, multiple ionization]

Description: K-Shell x-ray production cross sections for the target elements Sc, Ti, V, Mn, Fe, Co, and Ni were measured for incident /sup 10/B ions over the energy range 4.0 to 38.0 MeV. The cross section data were compared to the theoretical predictions of the binary encounter approximation (BEA); the plane wave born approximation (PWBA); and the PWBA modified to include corrections for increased binding energy (B), Coulomb deflection of the incident ion (C), orbital perturbation due to polarization (P), … more
Date: 1976~
Creator: Monigold, G.; McDaniel, F. D.; Duggan, J. L.; Mehta, R.; Rice, R. & Miller, P. D.
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Partner: UNT Libraries Government Documents Department
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MO x-ray production in collisions of F/sup +q/ with Ne. [19 MeV]

Description: The production of molecular-orbital (MO) x rays was observed in collisions of 19 MeV /sup 19/Fe/sup +q/ with Ne as a function of incident projectile charge state, q. The MO production rate was found to depend weakly upon the L-shell occupation number and to increase by an order of magnitude with an initial K-shell vacancy. Two incident projectile K-shell vacancies approximately doubled the single vacancy MO x-ray yield. 6 references
Date: 1978~
Creator: Peterson, R. S.; McDaniel, F. D.; Duggan, J. L.; Thoe, R. S. & Miller, P. D.
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Partner: UNT Libraries Government Documents Department
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L-shell x-ray production cross sections in Nd, Gd, Ho, Yb, Au and Pb for 25-MeV carbon and 32-MeV oxygen ions

Description: L-shell x-ray production cross sections in /sub 60/Nd, /sub 64/Gd, /sub 67/Ho, /sub 70/Yb, /sub 79/Au and /sub 82/Pb have been measured for incident 25 MeV /sub 6//sup 12/C/sup +q/(q = 4,5,6) and 32 MeV /sub 8//sup 16/O/sup +q/(q = 5,7,8) ions. Measurements were made on targets ranging in thickness from 1 to 100 ..mu..g/cm/sup 2/. Echancement in the L-shell x-ray production cross section for projectiles with one or two K-shell vacancies over those for projectiles with no K-shell vacancies is ob… more
Date: 1984~
Creator: Andrews, M. C.; McDaniel, F. D.; Duggan, J. L.; Mehta, R.; Lapicki, G.; Miller, P. D. et al.
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Partner: UNT Libraries Government Documents Department
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M-Shell Electron Capture and Direct Ionization of Gold by 25-MeV Carbon and 32-MeV Oxygen Ions

Description: M-shell x-ray production cross sections have been measured for thin solid targets of Au for 25 MeV /sup 12/C/sup q+/ (q = 4, 5, 6) and for 32 MeV /sup 16/O/sup q+/ (q = 5, 7, 8). The microscopic cross sections were determined from measurements made with targets ranging in thickness from 0.5 to 100 ..mu..g/cm/sup 2/. For projectiles with one or two K-shell vacancies, the M-shell x-ray production cross sections are found to be enhanced over those by projectiles without a K-shell vacancy. The sum … more
Date: 1984~
Creator: Andrews, M. C.; McDaniel, F. D.; Duggan, J. L.; Miller, P. D.; Pepmiller, P. L.; Krause, H. et al.
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department
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Projectile charge state dependence of M-shell ionization of Au, Pb, Bi, and U by 1. 42-MeV/amu fluorine ions

Description: The present study was undertaken to determine the direct ionization and electron capture contributions to vacancy production in the M-shells of /sub 79/Au, /sub 82/Pb, /sub 83/Bi and /sub 92/U for incident /sup 19//sub 9/F ions. M-shell x-ray production cross sections have been measured for 1.42-MeV/amu /sup 19//sub 9/Fq/sup +/ ions for q = 4,5,6,8,9. Enhancements in the target x-ray production cross sections were observed for projectiles with one and two K-shell vacancies over those without K-… more
Date: 1980~
Creator: Mehta, R.; Duggan, J.L.; McDaniel, F.D.; Andrews, M.C.; Wheeler, R.M.; Chaturvedi, R.P. et al.
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Partner: UNT Libraries Government Documents Department
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Ion Beam Induced Charge Collection (IBICC) Studies of Integrated Circuits Using a 10MeV Carbon Microbeam

Description: As feature sizes of Integrated Circuits (ICs) continue to shrinlL the sensitivity of these devices, particularly SRAMS and DR4Ms, to natural radiation is increasing. The radiation can lead to the uncontrolled deposition of charge within an IC, which ean alter, for example, the memoty state of a bit and thereby produce what is edled a `SOW error, or Single Event Upset (SEU). The response of ICS to natural background radiation is therefore of great coneem regarding the reliability of Mure devices… more
Date: September 29, 1998
Creator: Aton, T.J.; Bouanani, M. E.; Doyle, B.L.; Duggan, J.L.; Guo, B.N.; McDaniel, F.D. et al.
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department
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The Study of Phosphors Efficiency and Homogeneity using a Nuclear Microprobe

Description: Ion Beam Induced Luminescence (IBIL) and Ion Beam Induced Charge Collection (IBICC) have been applied in the study of the luminescence emission efficiency and investigation of the homogeneity of the luminescence emission in phosphors. The IBIL imaging was performed by using sharply focused ion beams or broad/partially-focused ion beams. The luminescence emission homogeneity in samples was examined to reveal possible distributed crystal-defects that may lead to the inhomogeneity of the luminesce… more
Date: December 8, 2000
Creator: Yang, C.; Doyle, Barney L.; Nigam, M.; El Bouanani, M.; Duggan, J. L. & Mcdaniel, F. D.
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Partner: UNT Libraries Government Documents Department
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Microbeam Studies of Diffusion Time Resolved Ion Beam Induced Charge Collection from Stripe-Like Junctions

Description: To design more radiation tolerant Integrated Circuits (ICs), it is essential to create and test accurate models of ionizing radiation induced charge collection dynamics within microcircuits. A new technique, Diffusion Time Resolved Ion Beam Induced Charge Collection (DTRIBICC), is proposed to measure the average arrival time of the diffused charge at the junction. Specially designed stripe-like junctions were experimentally studied using a 12 MeV carbon microbeam with a spot size of 1 {micro}m.… more
Date: June 14, 2000
Creator: Guo, B. N.; Bouanani, M. E.; Renfrow, S. N.; Walsh, David S.; Doyle, Barney L.; Aton, T. J. et al.
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Partner: UNT Libraries Government Documents Department
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Solutions to Defect-Related Problems in Implanted Silicon by Controlled Injection of Vacancies by High-Energy Ion Irradiation

Description: Amorphization and a dual implant technique have been used to manipulate residual defects that persist following implantation and post-implant thermal treatments. Residual defects can often be attributed to ion-induced defect excesses. A defect is considered to be excess when it occurs in a localized region at a concentration greater than its complement. Sources of excess defects include spatially separated Frenkel pairs, excess interstitials resulting from the implanted atoms, and sputtering. P… more
Date: November 4, 1998
Creator: Duggan, J.L.; Holland, O.W. & Roth, E.
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Partner: UNT Libraries Government Documents Department
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Ion Beam Induced Charge Collection (IBICC) from Integrated Circuit Test Structures Using a 10 MeV Carbon Microbeam

Description: As future sizes of Integrated Circuits (ICs) continue to shrink the sensitivity of these devices, particularly SRAMs and DRAMs, to natural radiation is increasing. In this paper, the Ion Beam Induced Charge Collection (IBICC) technique is utilized to simulate neutron-induced Si recoil effects in ICS. The IBICC measurements, conducted at the Sandia National Laboratories employed a 10 MeV carbon microbeam with 1pm diameter spot to scan test structures on specifically designed ICS. With the aid of… more
Date: November 18, 1998
Creator: Aton, T.J.; Doyle, B.L.; Duggan, J.L.; El Bouanani, M.; Guo, B.N.; McDaniel, F.D. et al.
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department
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