Profiling the Built-in Electrical Potential in III-V Multijunction Solar Cells: Preprint
Description:
We report on a direct measurement of the electrical potential on cross-sections of GaInP2/GaAs multiple-junction solar cells by using an ultrahigh-vacuum scanning Kelvin probe microscope (UHV-SKPM). The UHV-SKPM allows us to measure the potential without air molecules being adsorbed on the cross-sectional surface. Moreover, it uses a GaAs laser with photon energy of 1.4 eV for the atomic force microscope (AFM) operation. This eliminated the light-absorption-induced bottom-junction flattening an…
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Date:
May 1, 2006
Creator:
Jiang, C.-S.; Friedman, D. J.; Moutinho, H. R. & Al-Jassim, M. M.
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UNT Libraries Government Documents Department