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STRUCTURAL FLUCTUATIONS, ELECTRICAL RESPONSE AND THE RELIABILITY OF NANOSTRUCTURES (FINAL REPORT)

Description: The goal of the research supported by DOE-FG02-01ER45939 was to synthesize a number of experimental and theoretical approaches to understand the relationship between morphological fluctuations, the electrical response and the reliability (failure) of metallic nanostructures. The primary focus of our work was the study of metallic nanowires which we regard as prototypical of nanoscale interconnects. Our research plan has been to link together these materials properties and behaviors by understan… more
Date: July 31, 2006
Creator: Rous, Philip J.; Williams, Ellen D. & Fuhrer, Michael S.
Partner: UNT Libraries Government Documents Department
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