High-G testing of MEMS mechanical non-volatile memory and silicon re-entry switch.
Description:
Two different Sandia MEMS devices have been tested in a high-g environment to determine their performance and survivability. The first test was performed using a drop-table to produce a peak acceleration load of 1792 g's over a period of 1.5 ms. For the second test the MEMS devices were assembled in a gun-fired penetrator and shot into a cement target at the Army Waterways Experiment Station in Vicksburg Mississippi. This test resulted in a peak acceleration of 7191 g's for a duration of 5.5 ms…
more
Date:
October 1, 2005
Creator:
Baker, Michael Sean & Pohl, Kenneth Roy
Item Type:
Refine your search to only
Report
Partner:
UNT Libraries Government Documents Department