Silicon Heterojunction Solar Cell Characterization and Optimization Using In Situ and Ex Situ Spectroscopic Ellipsometry
Description:
The summary of this report is that: in situ SE gives insight into growth mechanisms and accurate layer thickness; (2) ex situ SE measures completed device structures to determine integrated optical properties; and (3) the combination of in situ and ex situ SE provides a powerful method for pinpointing the effects of processing changes in actual SHJ devices and guiding optimization.
Date:
May 1, 2006
Creator:
Levi, D.; Iwaniczko, E.; Page, M.; Branz, H. & Wang, T.
Item Type:
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Presentation
Partner:
UNT Libraries Government Documents Department