Description: After 5 y storage at Allied Signal, a subassembly with SA1388-1 diodes failed testing and the cause was an unacceptable current leak rate in one of the diodes. This was traced to a CuS deposit in a single production lot of diodes; however only about 0.3% failed the specification. A study was performed to determine the cause and potential long-term significance of this problem. Probable cause was determined to be the P-bearing braze material not being compatible with the Ag immersion plating solution (cyanide-based) and to the storage environment containing sulfur.
Date: June 1, 1996
Creator: Krska, C.; Stimetz, C.; Braithwaite, J.; Sorensen, R. & Hlava, P.
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department