417 Matching Results

Search Results

Advanced search parameters have been applied.

Interfacial Widths of Conjugated Polymer Bilayers

Description: The interfaces of conjugated polyelectrolyte (CPE)/poly[2-methoxy-5-(2{prime}-ethylhexyloxy)-p-phenylene vinylene] (MEH-PPV) bilayers cast from differential solvents are shown by resonant soft X-ray reflectivity (RSoXR) to be very smooth and sharp. The chemical interdiffusion due to casting is limited to less than 0.6 nm, and the interface created is thus nearly 'molecularly' sharp. These results demonstrate for the first time and with high precision that the nonpolar MEH-PPV layer is not much disturbed by casting the CPE layer from a polar solvent. A baseline is established for understanding the role of interfacial structure in determining the performance of CPE-based polymer light-emitting diodes. More broadly, we anticipate further applications of RSoXR as an important tool in achieving a deeper understanding of other multilayer organic optoelectronic devices, including multilayer photovoltaic devices.
Date: August 13, 2009
Creator: NCSU; Berkeley, UC; UCSB; Source, Advanced Light; Garcia, Andres; Yan, Hongping et al.
Partner: UNT Libraries Government Documents Department

Millimeter Wave Cloud Radar (MMCR) Handbook

Description: The millimeter cloud radar (MMCR) systems probe the extent and composition of clouds at millimeter wavelengths. The MMCR is a zenith-pointing radar that operates at a frequency of 35 GHz. The main purpose of this radar is to determine cloud boundaries (e.g., cloud bottoms and tops). This radar will also report radar reflectivity (dBZ) of the atmosphere up to 20 km. The radar possesses a doppler capability that will allow the measurement of cloud constituent vertical velocities.
Date: January 30, 2005
Creator: Widener, KB & Johnson, K
Partner: UNT Libraries Government Documents Department

EUV mask reflectivity measurements with micro-scale spatial resolution

Description: The effort to produce defect-free mask blanks for EUV lithography relies on increasing the detection sensitivity of advanced mask inspection tools, operating at several wavelengths. They describe the unique measurement capabilities of a prototype actinic (EUV) wavelength microscope that is capable of detecting small defects and reflectivity changes that occur on the scale of microns to nanometers. The defects present in EUV masks can appear in many well-known forms: as particles that cause amplitude or phase variations in the reflected field; as surface contamination that reduces reflectivity and contrast; and as damage from inspection and use that reduces the reflectivity of the multilayer coating. This paper presents an overview of several topics where scanning actinic inspection makes a unique contribution to EUVL research. They describe the role of actinic scanning inspection in defect repair studies, observations of laser damage, actinic inspection following scanning electron microscopy, and the detection of both native and programmed defects.
Date: February 1, 2008
Creator: Goldberg, Kenneth A.; Rekawa, Senajith B.; Kemp, Charles D.; Barty, Anton; Anderson, Erik; Kearney, Patrick et al.
Partner: UNT Libraries Government Documents Department

Arrayed resonant subwavelength gratings : LDRD 38618 final report.

Description: This report describes a passive, optical component called resonant subwavelength gratings (RSGs), which can be employed as one element in an RSG array. An RSG functions as an extremely narrow wavelength and angular band reflector, or mode selector. Theoretical studies predict that the infinite, laterally-extended RSG can reflect 100% of the resonant light while transmitting the balance of the other wavelengths. Experimental realization of these remarkable predictions has been impacted primarily by fabrication challenges. Even so, we will present large area (1.0mm) RSG reflectivity as high as 100.2%, normalized to deposited gold. Broad use of the RSG will only truly occur in an accessible micro-optical system. This program at Sandia is a normal incidence array configuration of RSGs where each array element resonates with a distinct wavelength to act as a dense array of wavelength- and mode-selective reflectors. Because of the array configuration, RSGs can be matched to an array of pixels, detectors, or chemical/biological cells for integrated optical sensing. Micro-optical system considerations impact the ideal, large area RSG performance by requiring finite extent devices and robust materials for the appropriate wavelength. Theoretical predictions and experimental measurements are presented that demonstrate the component response as a function of decreasing RSG aperture dimension and off-normal input angular incidence.
Date: November 1, 2003
Creator: Grotbeck, Carter L.; Kemme, Shanalyn A.; Wendt, Joel Robert; Warren, Mial E.; Samora, Sally; Carter, Tony Ray et al.
Partner: UNT Libraries Government Documents Department

Carbon contamination topography analysis of EUV masks

Description: The impact of carbon contamination on extreme ultraviolet (EUV) masks is significant due to throughput loss and potential effects on imaging performance. Current carbon contamination research primarily focuses on the lifetime of the multilayer surfaces, determined by reflectivity loss and reduced throughput in EUV exposure tools. However, contamination on patterned EUV masks can cause additional effects on absorbing features and the printed images, as well as impacting the efficiency of cleaning process. In this work, several different techniques were used to determine possible contamination topography. Lithographic simulations were also performed and the results compared with the experimental data.
Date: March 12, 2010
Creator: Fan, Y.-J.; Yankulin, L.; Thomas, P.; Mbanaso, C.; Antohe, A.; Garg, R. et al.
Partner: UNT Libraries Government Documents Department

Tri-material multilayer coatings with high reflectivity and wide bandwidth for 25 to 50 nm extreme ultraviolet light

Description: Magnesium/silicon carbide (Mg/SiC) multilayers have been fabricated with normal incidence reflectivity in the vicinity of 40% to 50% for wavelengths in the 25 to 50 nm wavelength range. However many applications, for example solar telescopes and ultrafast studies using high harmonic generation sources, desire larger bandwidths than provided by high reflectivity Mg/SiC multilayers. We investigate introducing a third material, Scandium, to create a tri-material Mg/Sc/SiC multilayer allowing an increase the bandwidth while maintaining high reflectivity.
Date: September 9, 2009
Creator: Aquila, Andrew; Salmassi, Farhad; Liu, Yanwei & Gullikson, Eric M.
Partner: UNT Libraries Government Documents Department

Thorough characterization of a EUV mask

Description: We reported that we were successful in our 45nm technology node device demonstration in February 2008 and 22nm node technology node device patterning in February 2009 using ASML's Alpha Demo Tool (ADT). In order to insert extreme ultraviolet (EUV) lithography at the 15nm technology node and beyond, we have thoroughly characterized one EUV mask, a so-called NOVACD mask. In this paper, we report on three topics, The first topic is an analysis of line edge roughness (LER) using a mask Scanning Electron Microscope (SEM), an Atomic Force Microscope (AFM) and the Actinic Inspection Tool (AIT) to compare resist images printed with the ASML ADT. The results of the analysis show a good correlation between the mask AFM and the mask SEM measurements, However, the resist printing results for the isolated space patterns are slightly different. The cause ofthis discrepancy may be resist blur, image log slope and SEM image quality and so on. The second topic is an analysis of mask topography using an AFM and relative reflectivity of mirror and absorber surface using the AIT, The AFM data show 6 and 7 angstrom rms roughness for mirror and absorber, respectively. The reflectivity measurements show that the mirror reflects EUV light about 20 times higher than absorber. The last topic is an analysis of a 32nm technology node SRAM cell which includes a comparison of mask SEM image, AIT image, resist image and simulation results. The ADT images of the SRAM pattern were of high quality even though the mask patters were not corrected for OPC or any EUV-specific effects. Image simulation results were in good agreement with the printing results.
Date: June 25, 2009
Creator: Mizuno, H.; McIntyre, G.; Koay, C.-W.; Burkhardt, M.; He, L.; Hartley, J. et al.
Partner: UNT Libraries Government Documents Department

Reflectivity of plasmas created by high-intensity, ultra-short laser pulses

Description: Experiments were performed to characterize the creation and evolution of high-temperature (T{sub e}{approximately}100eV), high-density (n{sub e}>10{sup 22}cm{sup {minus}3}) plasmas created with intense ({approximately}10{sup 12}-10{sup 16}W/cm{sup 2}), ultra-short (130fs) laser pulses. The principle diagnostic was plasma reflectivity at optical wavelengths (614nm). An array of target materials (Al, Au, Si, SiO{sub 2}) with widely differing electronic properties tested plasma behavior over a large set of initial states. Time-integrated plasma reflectivity was measured as a function of laser intensity. Space- and time-resolved reflectivity, transmission and scatter were measured with a spatial resolution of {approximately}3{mu}m and a temporal resolution of 130fs. An amplified, mode-locked dye laser system was designed to produce {approximately}3.5mJ, {approximately}130fs laser pulses to create and nonintrusively probe the plasmas. Laser prepulse was carefully controlled to suppress preionization and give unambiguous, high-density plasma results. In metals (Al and Au), it is shown analytically that linear and nonlinear inverse Bremsstrahlung absorption, resonance absorption, and vacuum heating explain time-integrated reflectivity at intensities near 10{sup 16}W/cm{sup 2}. In the insulator, SiO{sub 2}, a non-equilibrium plasma reflectivity model using tunneling ionization, Helmholtz equations, and Drude conductivity agrees with time-integrated reflectivity measurements. Moreover, a comparison of ionization and Saha equilibration rates shows that plasma formed by intense, ultra-short pulses can exist with a transient, non-equilibrium distribution of ionization states. All targets are shown to approach a common reflectivity at intensities {approximately}10{sup 16}W/cm{sup 2}, indicating a material-independent state insensitive to atomic or solid-state details.
Date: June 1, 1994
Creator: Gold, D.M.
Partner: UNT Libraries Government Documents Department

Stereoscopic Height Estimation from Multiple Aspect Synthetic Aperture Radar Images

Description: A Synthetic Aperture Radar (SAR) image is a two-dimensional projection of the radar reflectivity from a 3-dimensional object or scene. Stereoscopic SAR employs two SAR images from distinct flight paths that can be processed together to extract information of the third collapsed dimension (typically height) with some degree of accuracy. However, more than two SAR images of the same scene can similarly be processed to further improve height accuracy, and hence 3-dimensional position accuracy. This report shows how.
Date: August 1, 2001
Partner: UNT Libraries Government Documents Department

Structure of water adsorbed on a mica surface

Description: Monte Carlo simulations of hydration water on the mica (001) surface under ambient conditions revealed water molecules bound closely to the ditrigonal cavities in the surface, with a lateral distribution of approximately one per cavity, and water molecules interposed between K{sup +} counter ions in a layer situated about 2.5 {angstrom} from a surface O along a direction normal to the (001) plane. The calculated water O density profile was in quantitative agreement with recent X-ray reflectivity measurements indicating strong lateral ordering of the hydration water but liquid-like disorder otherwise.
Date: January 29, 2002
Creator: Park, Sung-Ho & Sposito, Garrison
Partner: UNT Libraries Government Documents Department

Measurement of the Shock-Heated Melt Curve of Lead Using Pyrometry and Reflectometry

Description: Data on the high-pressure melting temperatures of metals is of great interest in several fields of physics including geophysics. Measuring melt curves is difficult but can be performed in static experiments (with laser-heated diamond-anvil cells for instance) or dynamically (i.e., using shock experiments). However, at the present time, both experimental and theoretical results for the melt curve of lead are at too much variance to be considered definitive. As a result, we decided to perform a series of shock experiments designed to provide a measurement of the melt curve of lead up to about 50 GPa in pressure. At the same time, we developed and fielded a new reflectivity diagnostic, using it to make measurements on tin. The results show that the melt curve of lead is somewhat higher than the one previously obtained with static compression and heating techniques.
Date: January 1, 2004
Creator: Partouche-Sebban, D.; Pelissier, J. L.; Abeyta F. G.; Anderson, W. W.; Byers, M. E.; Dennis-Koller, D. et al.
Partner: UNT Libraries Government Documents Department

Integrated X-Ray Reflectivity Measurements for Elliptically Curved PET Crystals

Description: Spectroscopy provides valuable information about the temperature and density of a compressed pellet in a plasma. Elliptically curved pentaerythritol (PET) crystals are used as components for spectrometers. Their elliptical geometry gives several advantages related to spectral energy range, source focus, and spectral image compression.[1] The crystal curvature increases the spectrometer throughput but at the cost of a loss in resolution. Four different crystals are used in a spectrometer at the National Ignition Facility (NIF) target chamber at Lawrence Livermore National Laboratory (LLNL). Figure 1 shows the arrangement of the elliptical PET crystals in the snout of a NIF target diagnostic shown in Figure 2. The spectrum from the crystals is captured by four image plates located behind the crystals. A typical mandrel, the darkened section, upon which the PET crystal is glued, is shown in Figure 3, which also shows the complete ellipse. There are four elliptical segment types, each having the same major axis but a different minor axis. The crystals are 150 mm long in the diffraction direction and 25.4 mm high. Two crystals of each type were calibrated. The throughput for each spectrometer is determined by the integrated reflectivity of the PET crystal.[1] The goal of this effort was to measure the reflectivity curve of the PET curved crystal at several energies and determine the integrated reflectivity and the curve width as a function of the X-ray spectral energy and location on the ellipse where the beam strikes.
Date: April 26, 2012
Creator: Haugh, M J; Ross, P W; Regan, P W; Magoon, J; Shoup, M J; Barrios, M A et al.
Partner: UNT Libraries Government Documents Department

Native SrTiO3 (001) surface layer from resonant Ti L2,3 reflectance spectroscopy

Description: We quantitatively model resonant Ti L2,3 reflectivity Rs,p(q, hn) from several SrTiO3 (001) single crystals having different initial surface preparations and stored in ambient conditions before and between measurements. All samples exhibit unexpected 300 K Rs(hn) - Rp(hn) anisotropy corresponding to weak linear dichroism and tetragonal distortion of the TiO6 octahedra indicating a surface layer with properties different from cubic SrTiO3. Oscillations in Rs(q) confirm a ubiquitous surface layer 2-3 nm thick that evolves over a range of time scales. Resonant optical constant spectra derived from Rs,p(hn) assuming a uniform sample are refined using a single surface layer to fit measured Rs(q). Differences in surface layer and bulk optical properties indicate that the surface is significantly depleted in Sr and enriched in Ti and O. While consistent with the tendency of SrTiO3 surfaces toward non-stoichiometry, this layer does not conform simply to existing models for the near surface region and apparently forms via room temperature surface reactions with the ambient. This new quantitative spectral modeling approach is generally applicable and has potential to study near-surface properties of a variety of systems with unique chemical and electronic sensitivities.
Date: November 3, 2010
Creator: Valvidares, Manuel; Huijben, Mark; Yu, Pu; Ramesh, Ramamoorthy & Kortright, Jeffrey
Partner: UNT Libraries Government Documents Department

Molecular orientation in soft matter thin films studied by resonant soft X-ray reflectivity

Description: We present a technique to study depth profiles of molecular orientation in soft matter thin films with nanometer resolution. The method is based on dichroism in resonant soft X-ray reflectivity using linear s- and p-polarization. It combines the chemical sensitivity of Near-Edge X-ray Absorption Fine Structure spectroscopy to specific molecular bonds and their orientation relative to the polarization of the incident beam with the precise depth profiling capability of X-ray reflectivity. We demonstrate these capabilities on side chain liquid crystalline polymer thin films with soft X-ray reflectivity data at the carbon K edge. Optical constants of the anisotropic refractive index ellipsoid were obtained from a quantitative analysis using the Berreman formalism. For films up to 50 nm thickness we find that the degree of orientation of the long axis exhibits no depth variation and isindependent of the film thickness.
Date: January 12, 2011
Creator: Mezger, Markus; Jerome, Blandine; Kortright, Jeffrey B.; Valvidares, Manuel; Gullikson, Eric; Giglia, Angelo et al.
Partner: UNT Libraries Government Documents Department

Photoinduced changes of reflectivity in single crystals of YBa2Cu3O6.5 (Ortho II)

Description: We report measurements of the photoinduced change in reflectivity of an untwinned single crystal of YBa2Cu3O6.5 in the ortho II structure. The decay rate of the transient change in reflectivity is found to decrease rapidly with decreasing temperature and, below Tc, with decreasing laser intensity. We interpret the decay as a process of thermalization of antinodal quasiparticles, with a rate determined by inelastic scattering of quasiparticle pairs.
Date: March 14, 2002
Creator: Segre, Gino P.; Gedik, Nuh; Orenstein, Joseph; Bonn, Doug A.; Liang, Ruixing & Hardy, Walter N.
Partner: UNT Libraries Government Documents Department

Ka-Band ARM Zenith Radar (KAZR) Instrument Handbook

Description: The Ka-band ARM zenith radar (KAZR) is a zenith-pointing Doppler cloud radar operating at approximately 35 GHz. The KAZR is an evolutionary follow-on radar to ARM's widely successful millimeter-wavelength cloud radar (MMCR). The main purpose of the KAZR is to provide vertical profiles of clouds by measuring the first three Doppler moments: reflectivity, radial Doppler velocity, and spectra width. At the sites where the dual-polarization measurements are made, the Doppler moments for the cross-polarization channel are also available. In addition to the moments, velocity spectra are also continuously recorded for each range gate.
Date: March 6, 2012
Creator: Widener, K; Bharadwaj, N & Johnson, K
Partner: UNT Libraries Government Documents Department

Global Cooling: Effect of Urban Albedo on Global Temperature

Description: In many urban areas, pavements and roofs constitute over 60% of urban surfaces (roof 20-25%, pavements about 40%). The roof and the pavement albedo can be increased by about 0.25 and 0.10, respectively, resulting in a net albedo increase for urban areas of about 0.1. Many studies have demonstrated building cooling-energy savings in excess of 20% upon raising roof reflectivity from an existing 10-20% to about 60%. We estimate U.S. potential savings in excess of $1 billion (B) per year in net annual energy bills. Increasing albedo of urban surfaces can reduce the summertime urban temperature and improve the urban air quality. Increasing the urban albedo has the added benefit of reflecting more of the incoming global solar radiation and countering the effect of global warming. We estimate that increasing albedo of urban areas by 0.1 results in an increase of 3 x 10{sup -4} in Earth albedo. Using a simple global model, the change in air temperature in lowest 1.8 km of the atmosphere is estimated at 0.01K. Modelers predict a warming of about 3K in the next 60 years (0.05K/year). Change of 0.1 in urban albedo will result in 0.01K global cooling, a delay of {approx}0.2 years in global warming. This 0.2 years delay in global warming is equivalent to 10 Gt reduction in CO2 emissions.
Date: May 22, 2007
Creator: Akbari, Hashem; Menon, Surabi & Rosenfeld, Arthur
Partner: UNT Libraries Government Documents Department

Borehole Seismic Monitoring of Injected CO2 at the Frio Site

Description: As part of a small scale sequestration test (about 1500 tonsof CO2) in a saline aquifer, time-lapse borehole seismic surveys wereconducted to aid in characterization of subsurface CO2 distribution andmaterial property changes induced by the injected CO2. A VSP surveydemonstrated a large increase (about 75 percent) in seismic reflectivitydue to CO2 injection and allowed estimation of the spatial extent of CO2induced changes. A crosswell survey imaged a large seismic velocitydecrease (up to 500 m/s) within the injection interval and provided ahigh resolution image of this velocity change which maps the subsurfacedistribution of CO2 between two wells. Numerical modeling of the seismicresponse uses the crosswell measurements to show that this small CO2volume causes a large response in the seismic reflectivity. This resultdemonstrates that seismic detection of small CO2 volumes in salineaquifers is feasible and realistic.
Date: April 21, 2006
Creator: Daley, Thomas M.; Myer, Larry R.; Hoversten, G.M.; Peterson, JohnE. & Korneev, Valeri A.
Partner: UNT Libraries Government Documents Department

Cross-check of different techniques for two-dimensional powerspectral density measurements of X-ray optics

Description: The consistency of different instruments and methods for measuring two-dimensional (2D) power spectral density (PSD) distributions are investigated. The instruments are an interferometric microscope, an atomic force microscope (AFM) and the X-ray Reflectivity and Scattering experimental facility, all available at Lawrence Berkeley National Laboratory. The measurements were performed with a gold-coated mirror with a highly polished stainless steel substrate. It was shown that these three techniques provide essentially consistent results. For the stainless steel mirror, an envelope over all measured PSD distributions can be described with an inverse power-law PSD function. It is also shown that the measurements can be corrected for the specific spatial frequency dependent systematic errors of the instruments. The AFM and the X-ray scattering measurements were used to determine the modulation transfer function of the interferometric microscope. The corresponding correction procedure is discussed in detail. Lower frequency investigation of the 2D PSD distribution was also performed with a long trace profiler and a ZYGO GPI interferometer. These measurements are in some contradiction, suggesting that the reliability of the measurements has to be confirmed with additional investigation. Based on the crosscheck of the performance of all used methods, we discuss the ways for improving the 2D PSD characterization of X-ray optics.
Date: April 17, 2005
Creator: Yashchuk, Valeriy V.; Irick, Steve C.; Gullikson, Eric M.; Howells, Malcolm R.; MacDowell, Alastair A.; McKinney, Wayne R. et al.
Partner: UNT Libraries Government Documents Department

Use of microphysical relationships to discern growth/decay mechanisms of cloud droplets with focus on Z-LWC relationships.

Description: Cloud droplet size distributions hence the key microphysical quantities (e.g., radar reflectivity, droplet concentration, liquid water content, relative dispersion, and mean-volume radius) are determined by different physical mechanisms, including pre-cloud aerosols as CCNs, cloud updraft, and various turbulent entrainment-mixing processes. Therefore, different relationships among these microphysical properties are expected in response to these various mechanisms. The effect of turbulent entrainment-mixing processes is particularly vexing, with different entrainment-mixing processes likely leading to different microphysical relationships. Cloud radar has been widely used to infer the cloud liquid water content (L) from the measurement of radar reflectivity (Z) using a Z-L relationship. Existing Z-L expressions have been often obtained empirically, and differ substantially (Khain et al. 2008). The discrepancy among Z-L relations, which has been hindering the application of cloud radar in measuring cloud properties, likely stems from the different relationships between the relevant microphysical properties caused by different physical processes. This study first analyzes the Z-L relationship theoretically, and identify the key microphysical properties that affect this relationship, and then address the effects of various processes on the Z-L relationship by discerning the characteristics of the relationships between the relative dispersion, droplet concentration, liquid water content, and mean-volume radius calculated from in-situ measurements of cloud droplet size distributions. Effort is also made to further relate the microphysical relationships to physical processes such as turbulent entrainment-mixing.
Date: May 1, 2008
Creator: Liu,Y.; Daum, P.H.; Yum, S.S. & Wang, J.
Partner: UNT Libraries Government Documents Department

Fine-scale Horizontal Structure of Arctic Mixed-Phase Clouds.

Description: Recent in situ observations in stratiform clouds suggest that mixed phase regimes, here defined as limited cloud volumes containing both liquid and solid water, are constrained to narrow layers (order 100 m) separating all-liquid and fully glaciated volumes (Hallett and Viddaurre, 2005). The Department of Energy Atmospheric Radiation Measurement Program's (DOE-ARM, Ackerman and Stokes, 2003) North Slope of Alaska (NSA) ARM Climate Research Facility (ACRF) recently started collecting routine measurement of radar Doppler velocity power spectra from the Millimeter Cloud Radar (MMCR). Shupe et al. (2004) showed that Doppler spectra has potential to separate the contributions to the total reflectivity of the liquid and solid water in the radar volume, and thus to investigate further Hallett and Viddaurre's findings. The Mixed-Phase Arctic Cloud Experiment (MPACE) was conducted along the NSA to investigate the properties of Arctic mixed phase clouds (Verlinde et al., 2006). We present surface based remote sensing data from MPACE to discuss the fine-scale structure of the mixed-phase clouds observed during this experiment.
Date: July 10, 2006
Creator: Rambukkange,M.; Verlinde, J.; Elorante, E.; Luke, E.; Kollias, P. & Shupe, M.
Partner: UNT Libraries Government Documents Department

W-band ARM Cloud Radar (WACR) Handbook

Description: The W-band Atmospheric Radiation Measurement (ARM) Program Cloud Radar (WACR) systems are zenith pointing Doppler radars that probe the extent and composition of clouds at 95.04 GHz. The main purpose of this radar is to determine cloud boundaries (e.g., cloud bottoms and tops). This radar reports estimates for the first three spectra moments for each range gate up to 15 km. The 0th moment is reflectivity, the 1st moment is radial velocity, and the 2nd moment is spectral width. Also available are the raw spectra files. Unlike the millimeter wavelength cloud radar (MMCR), the WACR does not use pulse coding and operates in only copolarization and cross-polarization modes.
Date: January 5, 2005
Creator: Widener, K. B. & Johnson, K.
Partner: UNT Libraries Government Documents Department

Continuous Profiles of Cloud Microphysical Properties for the Fixed Atmospheric Radiation Measurement Sites

Description: The Atmospheric Radiation Measurement (ARM) Program defined a specific metric for the third quarter of Fiscal Year 2006 to produce and refine a one-year continuous time series of cloud microphysical properties based on cloud radar measurements for each of the fixed ARM sites. To accomplish this metric, we used a combination of recently developed algorithms that interpret radar reflectivity profiles, lidar backscatter profiles, and microwave brightness temperatures into the context of the underlying cloud microphysical structure.
Date: June 1, 2006
Creator: Jensen, M & Jensen, K
Partner: UNT Libraries Government Documents Department