Electron Backscatter Diffraction in Low Vacuum Conditions
Description:
Most current scanning electron microscopes (SEMs) have the ability to analyze samples in a low vacuum mode, whereby a partial pressure of water vapor is introduced into the SEM chamber, allowing the characterization of nonconductive samples without any special preparation. Although the presence of water vapor in the chamber degrades electron backscatter diffraction (EBSD) patterns, the potential of this setup for EBSD characterization of nonconductive samples is immense. In this chapter we disc…
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Date:
July 17, 2008
Creator:
El-Dasher, B S & Torres, S G
Item Type:
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Partner:
UNT Libraries Government Documents Department