Description: It is known that workloads are an important factor in soft error rates (SER), but it is proving difficult to find differentiating workloads for microprocessors. We have performed neutron beam irradiation studies of a commercial microprocessor under a wide variety of workload conditions from idle, performing no operations, to very busy workloads resembling real HPC, graphics, and business applications. There is evidence that the mean times to first indication of failure, MTFIF defined in Section II, may be different for some of the applications.
Date: January 1, 2009
Creator: Michalak, Sarah E; Graves, Todd L; Hong, Ted; Ackaret, Jerry; Sonny, Rao; Subhasish, Mitra et al.
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