64 Matching Results

Search Results

Advanced search parameters have been applied.

Hardening of transistor circuits to ionizing radiation

Description: It is shown experimentally that transistor circuits may have their fundamental sensitivities to ionizing radiation reduced by factors of ten by addition of a simple reverse biased diode. Bipolar transistors, field effect transistors and microcircuits have been hardened. (auth)
Date: September 10, 1965
Creator: Crowe, J.W.
Partner: UNT Libraries Government Documents Department

Information recovery from high-speed silver halide emulsions containing CRT traces after exposure to nuclear gamma radiation

Description: A data recovery problem often occurs in nuclear tests when photographic film used to record CRT traces is unavoidably exposed fo gamma rays before it can be retrieved for developing. Studies made to improve recovery of the CRT data from such film are described. Best results were obtained with a procedure involving reversal processing, silver intensification, dye-coupling development, and duplication. (auth)
Date: March 1, 1974
Creator: Dittmore, C. H.
Partner: UNT Libraries Government Documents Department

Absorption of short-pulse electromagnetic energy by a resistively loaded straight wire

Description: Absorption of short-pulse electromagnetic energy by a resistively loaded straight wire is examined. Energy collected by the wire, load energy, peak load currents, and peak load voltages are found for a wide range of parameters, with particular emphasis on nuclear electromagnetic pulse (EMP) phenomena. A series of time-sequenced plots is used to illustrate pulse propagation on wires when loads and wire ends are encountered. (auth)
Date: October 17, 1975
Creator: Miller, E.K.; Deadrick, F.J. & Landt, J.A.
Partner: UNT Libraries Government Documents Department

Attributes of system testing which promote cost-effectiveness

Description: A brief overview of conventional EMP testing activity examines attributes of overall systems tests which promote cost-effectiveness. The general framework represents an EMP-oriented systems test as a portion of a planned program to design, produce, and field system elements. As such, all so- called system tests should play appropriate cost-effective roles in this program, and the objective here is to disclose such roles. The intrinsic worth of such tests depends not only upon placing proper values on the outcomes, but also upon the possible eventual consequences of not doing tests. A relative worth measure is required. Attributes of EMP system testing over the range of potential activity which encompasses research and development, production, field handling, verification, evaluation, and others are reviewed and examined. Thus, the relative worth, in a cost-effective sense, is provided by relating such attributes to the overall program objectives so that values can be placed on the outcomes for tradeoff purposes. (auth)
Date: October 1, 1975
Creator: Martin, L.C.
Partner: UNT Libraries Government Documents Department

LLL transient-electromagnetics-measurement facility

Description: The operation and hardware of the Lawrence Livermore Laboratory's transient-electromagnetics (EM)-measurement facility are described. The transient-EM range is useful for determining the time-domain transient responses of structures to incident EM pulses. To illustrate the accuracy and utility of the EM-measurement facility, actual experimental measurements are compared to numerically computed values. (auth)
Date: October 29, 1975
Creator: Deadrick, F.J.; Miller, E.K. & Hudson, H.G.
Partner: UNT Libraries Government Documents Department