An x-ray fluorescence technique has been evaluated for measuring the coating thickness of two coating-substrate combinations. A quantitative theory has been developed in conjunction with the experimental data to support the results of the investigation. Results of measurements of zinc coatings on iron and nickel coatings on uranium are given. (auth)
It is shown that gold and silver plating thickness measurements made using an x-ray spectrograph could be closely correlated with thicknesses measured from sectional samples. Good correlations were also shown for single overlays of gold over silver when each layer was less than 0.0003 inch thick. (auth)
A self-contained instrument for the determination of bone mineral content by photon absorptometry is described. A high-resolution detection system allows measurements to be made at up to 16 photon energies. Control and arithmetic functions are performed by a microprocessor. Analysis capability and limitations are discussed. (auth)
A semiconductor detector x-ray spectrometer has been constructed for the analysis of elements in air particulate specimens. The excitation radiation is provided, either directly or indirectly, using a low power (40 watts) Ag anode x- ray tube. Less than 100 ng for most of the elements in the range Mg $Yields$ Zr, Pb are easily detected within two 1-minute counting intervals. A calibration technique for light element analysis and an experimental method which compensates for particle size effects are discussed. (auth)
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