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Application of the DG-1199 methodology to the ESBWR and ABWR.

Description: Appendix A-5 of Draft Regulatory Guide DG-1199 'Alternative Radiological Source Term for Evaluating Design Basis Accidents at Nuclear Power Reactors' provides guidance - applicable to RADTRAD MSIV leakage models - for scaling containment aerosol concentration to the expected steam dome concentration in order to preserve the simplified use of the Accident Source Term (AST) in assessing containment performance under assumed design basis accident (DBA) conditions. In this study Economic and Safe Boiling Water Reactor (ESBWR) and Advanced Boiling Water Reactor (ABWR) RADTRAD models are developed using the DG-1199, Appendix A-5 guidance. The models were run using RADTRAD v3.03. Low Population Zone (LPZ), control room (CR), and worst-case 2-hr Exclusion Area Boundary (EAB) doses were calculated and compared to the relevant accident dose criteria in 10 CFR 50.67. For the ESBWR, the dose results were all lower than the MSIV leakage doses calculated by General Electric/Hitachi (GEH) in their licensing technical report. There are no comparable ABWR MSIV leakage doses, however, it should be noted that the ABWR doses are lower than the ESBWR doses. In addition, sensitivity cases were evaluated to ascertain the influence/importance of key input parameters/features of the models.
Date: September 1, 2010
Creator: Kalinich, Donald A.; Gauntt, Randall O. & Walton, Fotini
Partner: UNT Libraries Government Documents Department

Modeling Cu Migration in CdTe Solar Cells Under Device-Processing and Long-Term Stability Conditions: Preprint

Description: An impurity migration model for systems with material interfaces is applied to Cu migration in CdTe solar cells. In the model, diffusion fluxes are calculated from the Cu chemical potential gradient. Inputs to the model include Cu diffusivities, solubilities, and segregation enthalpies in CdTe, CdS and contact materials. The model yields transient and equilibrium Cu distributions in CdTe devices during device processing and under field-deployed conditions. Preliminary results for Cu migration in CdTe photovoltaic devices using available diffusivity and solubility data from the literature show that Cu segregates in the CdS, a phenomenon that is commonly observed in devices after back-contact processing and/or stress conditions.
Date: May 1, 2008
Creator: Teeter, G. & Asher, S.
Partner: UNT Libraries Government Documents Department