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Technical report on task orders no. B239703 and B239705: Development of technology of Al-free high-power laser diodes

Description: Our investigations of InGaAsP/GaAs system have shown that it is in many ways superior to the conventional AlGaAs/GaAs system. Lasers fabricated from InGaAsP/GaAs exhibit low facet overheating, high efficiency, good degradation characteristics, and high catastrophic optical damage (COD) limit. Our postgrowth technology provides stripe- contact lasers having very low series resistance and, therefore, high electrical-to-optical efficiency.
Date: June 1, 1996
Creator: Alferov, Zh.I. & Tarasov, I.S.
Partner: UNT Libraries Government Documents Department

Liquid phase epitaxial growth of GaAs

Description: Research into new semiconductor materials for measurement of electromagnetic radiation over a wide range of energies has been an active field for several decades. There is a strong desire to identify and develop new materials which can lead to improved detectors. Such devices are expected to solve problems that cannot be solved using the semiconductor materials and device structures which have been traditionally used for radiation detection. In order for a detector which is subjected to some type of irradiation to respond, the radiation must undergo an interaction with the detector. The net result of the radiation interaction in a broad category of detectors is the generation of mobile electric charge carriers (electrons and/or holes) within the detector active volume. This charge is collected at the detector contacts and it forms the basic electrical signal. Typically, the collection of the charge is accomplished through the imposition of an electric field within the detector which causes the positive and/or negative charges created by the radiation to flow in opposite directions to the contacts. For the material to serve as a good radiation detector, a large fraction (preferably 100%) of all carriers created by the interacting incident radiation must be collected. Charge trapping by deep level impurities and structural defects can seriously degrade detector performance. The focus of this thesis is on far infrared and X-ray detection. In X-ray detector applications of p-I-n diodes, the object is to measure accurately the energy distribution of the incident radiation quanta. One important property of such detectors is their ability to measure the energy of individual incident photons with high energy resolution.
Date: October 1, 1997
Creator: Wynne, D. I.
Partner: UNT Libraries Government Documents Department

Investigation of epitaxial silicon layers as a material for radiation hardened silicon detectors

Description: Epitaxial grown thick layers (>100 {mu}m) of high resistivity silicon (Epi-Si) have been investigated as a possible candidate of radiation hardened material for detectors for high-energy physics. As grown Epi-Si layers contain high concentration (up to 2{center_dot}10{sup 12} cm{sup {minus}3}) of deep levels compared with that in standard high resistivity bulk Si. After irradiation of test diodes by protons (E{sub p} = 24 GeV) with a fluence of 1.5{center_dot}10{sup 11} cm{sup {minus}2}, no additional radiation induced deep traps have been detected. A reasonable explanation is that there is a sink of primary radiation induced defects, in epitaxial layers. The {open_quotes}sinking{close_quotes} process, however, becomes non-effective at high radiation fluences (10{sup 14} cm{sup {minus}2}) due to saturation of epitaxial defects by high concentration of radiation induced ones. As a result, at neutron fluence of 1{center_dot}10{sup 14}cm{sup {minus}2} the deep level spectrum corresponds to well-known spectrum of radiation induced defects in high resistivity bulk Si. The net effective concentration in the space charge region equals to 3{center_dot}10{sup 12} cm{sup {minus}3} after 3 months of room temperature storage and reveals similar annealing behavior for epitaxial as compared to bulk silicon.
Date: November 1, 1997
Creator: Li, Z.; Eremin, V.; Ilyashenko, I. & Ivanov, A.
Partner: UNT Libraries Government Documents Department

Phase stability in Ga{sub x}In{sub 1{minus}x}As{sub y}Sb{sub 1{minus}y}/GaSb heterostructures

Description: The crystallographic and microstructural characteristics of liquid phase epitaxy lattice-matched In{sub x}Ga{sub (1{minus}x)}As{sub y}Sb{sub (1{minus}y)}/GaSb (100) heterostructures is presented. Using both transmission electron microscopy and high resolution X-ray diffraction, a variety of diffusional based phase transformations in the epitaxial films are observed, including: spinodal decomposition, compositional modulations of the order of 30 nm, and weak long range ordering. These results are interpreted in terms of the possible influence of substrate surface structure on the phase stability of epitaxial layers.
Date: October 1, 1998
Creator: Chen, Y.C.; Bucklen, V.; Rajan, K.; Freeman, M.; Cardines, R.P. Jr.; Nichols, G. et al.
Partner: UNT Libraries Government Documents Department

Microstructural stability in LPE Ga{sub x}In{sub (1{minus}x)}As{sub y}Sb{sub (1{minus}y)}/GaSb heterostructures

Description: The morphological and structural characteristics associated with the growth of lattice matched In{sub x}Ga{sub (1{minus}x)}As{sub y}Sb{sub (1{minus}y)}/GaSb (100) heterostructures is presented. The experiments focused on studying the effect of growth on vicinal surfaces tilted from the exact (100) orientation as well as variations in epilayer chemistry. It was found that variations in these process parameters had very strong effects on both the nucleation characteristics of the epilayer and the atomistic scale homogeneity of the alloy. The <100> and <110> variants in compositional modulation/phase separation were detected, as well as the evolution of weak (110) ordering. These results are discussed in the context of other studies on phase stability in III-V epitaxial structures, especially in terms of surface reconstruction and kinetic effects near conditions of spinodal decomposition.
Date: June 1, 1998
Creator: Chen, C.Y.; Bucklen, V.; Rajan, K.; Freeman, M. & Cardines, R.P.
Partner: UNT Libraries Government Documents Department

Advanced far infrared blocked impurity band detectors based on germanium liquid phase epitaxy

Description: This research has shown that epilayers with residual impurity concentrations of 5 x 10{sup 13} cm{sup {minus}3} can be grown by producing the purest Pb available in the world. These epilayers have extremely low minority acceptor concentrations, which is ideal for fabrication of IR absorbing layers. The Pb LPE growth of Ge also has the advantageous property of gettering Cu from the epilayer and the substrate. Epilayers have been grown with intentional Sb doping for IR absorption on lightly doped substrates. This research has proven that properly working Ge BIB detectors can be fabricated from the liquid phase as long as pure enough solvents are available. The detectors have responded at proper wavelengths when reversed biased even though the response did not quite reach minimum wavenumbers. Optimization of the Sb doping concentration should further decrease the photoionization energy of these detectors. Ge BIB detectors have been fabricated that respond to 60 cm{sup {minus}1} with low responsivity. Through reduction of the minority residual impurities, detector performance has reached responsivities of 1 A/W. These detectors have exhibited quantum efficiency and NEP values that rival conventional photoconductors and are expected to provide a much more sensitive tool for new scientific discoveries in a number of fields, including solid state studies, astronomy, and cosmology.
Date: May 1, 1998
Creator: Olsen, C.S.
Partner: UNT Libraries Government Documents Department

Peculiarities of spin reorientation in a thin YIG film.

Description: The issue of magnetic orientation transitions in thin films combines interesting physics and importance for applications. We study the magnetic transition and phase diagram of a 0.1{micro}m thick (YLaGd){sub 3}(FeGa){sub 5}O{sub 12} films grown on GGG substrate by liquid phase epitaxy. Observed transitions are compared with those in BiGa:TmIG thin films, studied in previous work by one of the authors. A general picture of orientation transitions in thin films of substituted YIG is discussed.
Date: June 28, 2002
Creator: Bazaliy, Ya. B.; Tsymbal, L. T.; Linnik, A. I.; Dan'shin, N. K.; Izotov, A. I. & Wigen, P. E.
Partner: UNT Libraries Government Documents Department

GaInSb and GaInAsSb thermophotovoltaic device fabrication and characterization

Description: Thermophotovoltaic (TPV) devices have been fabricated using epitaxial ternary and quaternary layers grown on GaSb substrates. The GaInSb layers were grown by organometallic vapor phase epitaxy (OMVPE) and the InGaAsSb lattice-matched layers were grown by liquid phase epitaxy (LPE). Device fabrication steps include unannealed p-type ohmic contacts, annealed Sn/Au n-type ohmic contacts, and a thick Ag top-surface contact using a lift-off process. Devices are characterized primarily by dark I-V, photo I-V, and quantum efficiency measurements, which are correlated to microscopic and macroscopic material properties. Particular emphasis has been on material enhancements to increase quantum efficiency and decrease dark saturation current density. TPV device performance is presently limited by the base diffusion length, typically 1 to 2 microns.
Date: May 1, 1997
Creator: Hitchcock, C.; Gutmann, R.; Borrego, J.; Ehsani, H.; Bhat, I.; Freeman, M. et al.
Partner: UNT Libraries Government Documents Department

Ternary and quaternary antimonide devices for thermophotovoltaic applications

Description: Thermophotovoltaic (TPV) devices have been fabricated using epitaxial ternary and quaternary layers grown on GaSb substrates. GaInSb ternary devices were grown by metalorganic vapor phase epitaxy (MOVPE) with buffer layers to accommodate the lattice mismatch, and GaInAsSb lattice-matched quaternaries were grown by MOVPE and by liquid phase epitaxy (LPE). Improved devices are obtained when optical absorption occurs in the p-layer due to the longer minority carrier diffusion length. Thick emitter p/n devices are limited by surface recombination, with highest quantum efficiency and lowest dark current being achieved with epitaxially grown surface passivation layers on lattice-matched MOVPE quaternaries. Thin emitter/thick base n/p devices are very promising, but require improved shallow high-quality n-type ohmic contacts.
Date: June 1, 1998
Creator: Hitchcock, C.W.; Gutmann, R.J.; Ehsani, H.; Bhat, I.B.; Wang, C.A.; Freeman, M.J. et al.
Partner: UNT Libraries Government Documents Department

Liquid phase epitaxial growth and characterization of germanium far infrared blocked impurity band detectors

Description: Germanium Blocked Impurity Band (BIB) detectors require a high purity blocking layer (&lt; 10{sup 13} cm{sup -3}) approximately 1 mm thick grown on a heavily doped active layer ({approx} 10{sup 16} cm{sup -3}) approximately 20 mm thick. Epilayers were grown using liquid phase epitaxy (LPE) of germanium out of lead solution. The effects of the crystallographic orientation of the germanium substrate on LPE growth modes were explored. Growth was studied on substrates oriented by Laue x-ray diffraction between 0.02{sup o} and 10{sup o} from the {l_brace}111{r_brace} toward the {l_brace}100{r_brace}. Terrace growth was observed, with increasing terrace height for larger misorientation angles. It was found that the purity of the blocking layer was limited by the presence of phosphorus in the lead solvent. Unintentionally doped Ge layers contained {approx}10{sup 15} cm{sup -3} phosphorus as determined by Hall effect measurements and Photothermal Ionization Spectroscopy (PTIS). Lead purification by vacuum distillation and dilution reduced the phosphorus concentration in the layers to {approx} 10{sup 14} cm{sup -3} but further reduction was not observed with successive distillation runs. The graphite distillation and growth components as an additional phosphorus source cannot be ruled out. Antimony ({approx}10{sup 16} cm{sup -3}) was used as a dopant for the active BIB layer. A reduction in the donor binding energy due to impurity banding was observed by variable temperature Hall effect measurements. A BIB detector fabricated from an Sb-doped Ge layer grown on a pure substrate showed a low energy photoconductive onset ({approx}6 meV). Spreading resistance measurements on doped layers revealed a nonuniform dopant distribution with Sb pile-up at the layer surface, which must be removed by chemomechanical polishing. Sb diffusion into the pure substrate was observed by Secondary Ion Mass Spectroscopy (SIMS) for epilayers grown at 650 C. The Sb concentration at the interface dropped by an order of ...
Date: May 12, 2001
Creator: Bandaru, Jordana
Partner: UNT Libraries Government Documents Department

Study and development of tunable, single mode AlGaAs/GaAs lasers

Description: Liquid phase epitaxy has been employed in this study to fabricate two-section wavelength tunable lasers. GaAs/AlGaAs and In GaAsP/InP material system have been used for fabricating the lasers. Both direct (butt) coupling and evanescent coupling approaches have been studied. The complications associated with the regrowth process have been responsible for poor laser performance. Some DBR gratings for three-section lasers have been made using the electron beam lithography at UCSD. A simple set up has been tested to measure the wavelength shift of GaAs/AlGaAs lasers. Also, a simple structure which avoids the regrowth process has been proposed for the two-section laser. 9 refs., 14 figs.
Date: September 1, 1990
Creator: Yu, P.K.L. & Liu, J.C. (California Univ., San Diego, La Jolla, CA (USA). Dept. of Electrical and Computer Engineering)
Partner: UNT Libraries Government Documents Department