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in subjects: "Lead Iodides"  
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Analysis of HgI{sub 2} and PbI{sub 2} crystals and detectors by particle-induced x-ray emission (PIXE) and ion backscattering spectroscopy (IBS)

Description: The Ion Micro-Analysis Group (IMAG) in Livermore conducts quantitative trace elemental analysis with PIXE and depth profiling with IBS using an MeV ion microbeam. The system has the capability to produce two-dimensional trace element and IBS images. PIXE analyses have been conducted on HgI{sub 2} and PbI{sub 2} crystals and detector materials in order to identify and quantify near surface trace contaminants. IBS measurements have been conducted to investigate elemental depth distributions in va… more
Date: March 1, 1993
Creator: Bench, G. S.; Heikkinen, D. W.; Antolak, A. J.; Morse, D. H.; Pontau, A. E.; James, R. B. et al.
Item Type: Refine your search to only Article
Partner: UNT Libraries Government Documents Department
open access

Lead iodide X-ray and gamma-ray spectrometers for room and high temperature operation

Description: In this study, we report on the results of the investigation of lead iodide material properties. The effectiveness of zone refining purification methods on the material purity is determined by ICP-MS and ICP-OES and correlated to the electrical and physical material properties. We show that this zone refining method is very efficient in removing impurities from lead iodide and we also determine the segregation coefficient for some of these impurities. Triple axis x- ray diffraction (TAD) analys… more
Date: February 1, 1997
Creator: Hermon, H.; James, R. B. & Cross, E.
Item Type: Refine your search to only Report
Partner: UNT Libraries Government Documents Department
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