Submillimeter and microwave residual losses in epitaxial films of Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O
Description:
We have used a novel bolometric technique and a resonant technique to obtain accurate submillimeter and microwave residual loss data for epitaxial thin films of YBa{sub 2}Cu{sub 3}O{sub 7}, Tl{sub 2}Ca{sub 2}Ba{sub 2}Cu{sub 3}O{sub 10} and Tl{sub 2}CaBa{sub 2}Cu{sub 2}O{sub 8}. For all films we obtain good agreement between the submillimeter and microwave data, with the residual losses in both the Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O films scaling approximately as frequency squared below {approximately}…
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Date:
December 1, 1992
Creator:
Miller, D; Richards, P. L.; Eom, C. B.; Geballe, T. H.; Garrison, S. M.; Newman, N. et al.
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