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Effect of Inert Gas Additive Species on Cl(2) High Density Plasma Etching of Compound Semiconductors: Part 1. GaAs and GaSb

Description: The role of the inert gas additive (He, Ar, Xe) to C12 Inductively Coupled Plasmas for dry etching of GaAs and GaSb was examined through the effect on etch rate, surface roughness and near-surface stoichiometry. The etch rates for both materials go through a maximum with Clz 0/0 in each type of discharge (C12/'He, C12/Ar, C12/Xc), reflecting the need to have efficient ion-assisted resorption of the etch products. Etch yields initially increase strongly with source power as the chlorine neutral density increases, but decrease again at high powers as the etching becomes reactant-limited. The etched surfaces are generally smoother with Ax or Xe addition, and maintain their stoichiometry.
Date: December 23, 1998
Creator: Abernathy, C.R.; Cho, H.; Hahn, Y.B.; Hays, D.C.; Jung, K.B.; Pearton, S.J. et al.
Partner: UNT Libraries Government Documents Department

Spectral ellipsometry of GaSb and GaInAsSb: Experiment and modeling

Description: The optical constants {epsilon}(E)[={epsilon}{sub 1}(E)+i{epsilon}{sub 2}(E)] of single-crystal GaSb at 300K have been measured using spectral ellipsometry in the range of 0.3-5.3 eV. The {epsilon}(E) spectra displayed distinct structures associated with critical points (CPs) at E{sub 0} (direct gap), spin-orbit split E{sub 0}+{Delta}{sub 0} component, spin-orbit split (E{sub 1}, E{sub 1}+{Delta}{sub 1}) and (E{sub 0}{prime}, E{sub 0}{prime}+{Delta}{sub 0}{prime}) doublets, as well as E{sub 2}. The experimental data over the entire measured spectral range (after oxide removal) has been fit using the Holden model dielectric function based on the electronic energy-band structure near these CPs plus excitonic and band-to-band Coulomb enhancement effects at E{sub 0}, E{sub 0}+{Delta}{sub 0} and the E{sub 1}, E{sub 1}+{Delta}{sub 1} doublet. In addition to evaluating the energies of these various band-to-band CPs, information about the binding energy (R{sub 1}) of the two-dimensional exciton related to the E{sub 1}, E{sub 1}+{Delta}{sub 1} CPs was obtained. The value of R{sub 1} was in good agreement with effective mass/k{sup {rightharpoonup}}{center_dot}p{sup {rightharpoonup}} theory. The ability to evaluate R{sub 1} has important ramifications for recent first-principles band structure calculations which include exciton effects at E{sub 0}, E{sub 1}, and E{sub 2}. The experimental results were compared to other evaluations of the optical constants of GaSb.
Date: June 30, 1999
Creator: Charache, G.W.; Mu {tilde n}oz, M.; Wei, K.; Pollak, F.H. & Freeouf, J.L.
Partner: UNT Libraries Government Documents Department

Antimonide-Based Long-Wavelength Lasers on GaAs Substrates

Description: We have investigated the use of GaAsSb in edge-emitting laser active regions, in order to obtain lasing near 1.3 {micro}m. Single quantum well GaAsSb devices display electroluminescence at wavelengths as long as 1.34 {micro}m, but substantial blueshifts occur under high injection conditions. GaAsSb single quantum well edge emitters have been obtained which lase at 1.275 {micro}m with a room-temperature threshold current density as low as 535 A/cm{sup 2}. Modification of the basic GaAsSb/GaAs structure with the addition of InGaAs layers results in a strongly type-II band alignment which can be used to further extend the emission wavelength of these devices. Using GaAsSb/InGaAs active regions, lasers emitting at 1.17 {micro}m have been obtained with room-temperature threshold current densities of 120 A/cm{sup 2}, and devices operating at 1.29 {micro}m have displayed thresholds as low as 375 A/cm{sup 2}. Characteristic temperatures for devices employing various GaAsSb-based active regions have been measured to be 60-73 K.
Date: August 17, 2000
Creator: KLEM,JOHN F. & Blum, O.
Partner: UNT Libraries Government Documents Department

Spectral ellipsometry of GaSb: Experiment and modelling

Description: The optical constants {epsilon}(E)[{equals}{epsilon}{sub 1}(E) + i{epsilon}{sub 2}(E)] of single crystal GaSb at 300K have been measured using spectral ellipsometry in the range of 0.3--5.3 eV. The {epsilon}(E) spectra displayed distinct structures associated with critical points (CPs) at E{sub 0}(direct gap), spin-orbit split E{sub 0} + {Delta}{sub 0} component, spin-orbit split (E{sub 1}), E{sub 1} + {Delta}{sub 1} and (E{sub 0}{prime}), E{sub 0}{prime} + {Delta}{sub 0}{prime} doublets, as well as E{sub 2}. The experimental data over the entire measured spectral range (after oxide removal) has been fit using the Holden model dielectric function [Phys.Rev.B 56, 4037 (1997)] based on the electronic energy-band structure near these CPs plus excitonic and band-to-band Coulomb enhancement effects at E{sub 0}, E{sub 0} + {Delta}{sub 0}and the E{sub 1}, E{sub 1} + {Delta}{sub 1} doublet. In addition to evaluating the energies of these various band-to-band CPs, information about the binding energy (R{sub 1}) of the two-dimensional exciton related to the E{sub 1}, E{sub 1} + {Delta}{sub 1} CPS was obtained. The value of R{sub 1} was in good agreement with effective mass/{rvec k} {center_dot} {rvec p} theory. The ability to evaluate R{sub 1} has important ramifications for recent first-principles band structure calculations which include exciton effects at E{sub 0}, E{sub 1}, and E{sub 2}.
Date: May 1, 1999
Creator: Charache, G.W.; Mu {tilde n}oz, M.; Wei, K.; Pollak, F.H. & Freeouf, J.L.
Partner: UNT Libraries Government Documents Department

III-Sb (001) growth surfaces: Structure and island nucleation

Description: The authors have determined the reconstructions present on AlSb and GaSb(001) under conditions typical for device growth by molecular beam epitaxy. Within the range of Sb flux and temperature where the diffraction pattern is nominally (1 x 3), three distinct (4 x 3) reconstructions actually occur. The three structures are different than those previously proposed for these growth conditions, with two incorporating mixed III-V dimers on the surface. The presence of these hetero-dimers in the top Sb layer leads to an island nucleation and growth mechanism fundamentally different than for other III-V systems.
Date: April 24, 2000
Creator: BARVOSA-CARTER,W.; BRACKER,A.S.; CULBERTSON,J.C.; NOSHO,B.Z.; SHANABROOK,B.V.; WHITMAN,L.J. et al.
Partner: UNT Libraries Government Documents Department

Multi-staged, InAsSb mid-infrared lasers and light-emitting diodes, grown by MOCVD

Description: Due to lower nonradiative rates, mid-infrared (2-6 micron) lasers with strained, narrow bandgap, Sb-based active regions have the potential to operate at lower current density and higher temperature than competing devices. Superior performance may be achieved through the {open_quotes}band structure engineered{close_quotes} reduction of Auger recombination and the implementation of multi-stage (or {open_quotes}cascaded{close_quotes}) active regions. We describe the first lasers and LEDs utilizing strained InAsSb, multi-stage active regions. An (n)InAs / (p)GaAsSb semimetal layer is incorporated into each stage as an internal electron-hole source. To date, 2-stage LEDs and 2-stage lasers have been demonstrated. Our multi-stage devices were grown by MOCVD.
Date: September 1, 1997
Creator: Kurtz, S.R.; Allerman, A.A.; Biefeld, R.M. & Baucom, K.C.
Partner: UNT Libraries Government Documents Department

Inductively Coupled Plasma Etching in ICl- and IBr-Based Chemistries: Part I. GaAs, GaSb and AlGaAs

Description: High density plasma etching of GaAs, GaSb and AIGaAs was performed in IC1/Ar and lBr/Ar chemistries using an Inductively Coupled Plasma (ICP) source. GaSb and AlGaAs showed maxima in their etch rates for both plasma chemistries as a function of interhalogen percentage, while GaAs showed increased etch rates with plasma composition in both chemistries. Etch rates of all materials increased substantially with increasing rf chuck power, but rapidly decreased with chamber pressure. Selectivities > 10 for GaAs and GaSb over AlGaAs were obtained in both chemistries. The etched surfaces of GaAs showed smooth morphology, which were somewhat better with IC1/Ar than with IBr/& discharge. Auger Electron Spectroscopy analysis revealed equi-rate of removal of group III and V components or the corresponding etch products, maintaining the stoichiometry of the etched surface.
Date: November 23, 1998
Creator: Abernathy, C.R.; Cho, H.; Hahn, Y.B.; Hays, D.C.; Hobson, W.S.; Jung, K.B. et al.
Partner: UNT Libraries Government Documents Department

Reactive Ion Beam Etching of GaAs and Related Compounds in an Inductively Coupled Plasma of Cl(2)-Ar Mixture

Description: Reactive ion beam etching (RD3E) of GaAs, GaP, AIGaAs and GaSb was performed in a Cl2-Ar mixture using an Inductively Coupled Plasma (ICP) source. `The etch rates and yields were strongly affected by ion energy and substrate temperature. The RJBE was dominated by ion-assisted etching at <600 eV and by physical sputtering beyond 600 eV. The temperature dependence of the etch rates revealed three different regimes, depending on the substrate temperature: 1) sputtering-etch limited, 2) products-resorption limited, and 3) mass-transfer limited regions. GaSb showed the overall highest etch rates, while GaAs and AIGaAs were etched at the same rates. The etched features showed extremely smooth morphologies with anisotropic sidewalls.
Date: November 23, 1998
Creator: Abernathy, C.R.; Hahn, Y.B.; Hays, D.; Lambers, E.S.; Lee, J.W.; Pearton, S.J. et al.
Partner: UNT Libraries Government Documents Department

Self- and zinc diffusion in gallium antimonide

Description: The technological age has in large part been driven by the applications of semiconductors, and most notably by silicon. Our lives have been thoroughly changed by devices using the broad range of semiconductor technology developed over the past forty years. Much of the technological development has its foundation in research carried out on the different semiconductors whose properties can be exploited to make transistors, lasers, and many other devices. While the technological focus has largely been on silicon, many other semiconductor systems have applications in industry and offer formidable academic challenges. Diffusion studies belong to the most basic studies in semiconductors, important from both an application as well as research standpoint. Diffusion processes govern the junctions formed for device applications. As the device dimensions are decreased and the dopant concentrations increased, keeping pace with Moore's Law, a deeper understanding of diffusion is necessary to establish and maintain the sharp dopant profiles engineered for optimal device performance. From an academic viewpoint, diffusion in semiconductors allows for the study of point defects. Very few techniques exist which allow for the extraction of as much information of their properties. This study focuses on diffusion in the semiconductor gallium antimonide (GaSb). As will become clear, this compound semiconductor proves to be a powerful one for investigating both self- and foreign atom diffusion. While the results have direct applications for work on GaSb devices, the results should also be taken in the broader context of III-V semiconductors. Results here can be compared and contrasted to results in systems such as GaAs and even GaN, indicating trends within this common group of semiconductors. The results also have direct importance for ternary and quaternary semiconductor systems used in devices such as high speed InP/GaAsSb/InP double heterojunction bipolar transistors (DHBT) [Dvorak, (2001)]. Many of the findings which will ...
Date: March 26, 2002
Creator: Nicols, Samuel Piers
Partner: UNT Libraries Government Documents Department

Auger and Radiative Recombination Coefficients in 0.55 eV InGaAsSb

Description: A radio-frequency (RF) photoreflectance technique, which senses changes in sample conductivity as carriers recombine following excitation by a laser pulse, has been used to measure the recombination parameters in 0.55 eV InGaAsSb lattice matched to GaSb. Doubly-capped lifetime structures with variable active layer thicknesses are used to extract the surface recombination velocity (SRV), while analysis of the samples with different doping concentrations is used to obtain Auger (C) and radiative (B) recombination parameters. Parameter extraction for the samples evaluated gives C = 1 {+-} 0.4 x 10{sup -28} cm{sup 6}/s and B = 3 {+-} 1.5 x 10{sup -11} cm{sup 3}/s for 0.55 eV InGaAsSb lattice matched to GaSb. The Auger and radiative recombination coefficients obtained from high-level injection decay times in low doping concentration samples show very good agreement with values obtained from low-level injection conditions.
Date: August 4, 2004
Creator: Wang, CA & Nichols, G
Partner: UNT Libraries Government Documents Department

Czochralski growth of gallium indium antimonide alloy crystals

Description: Attempts were made to grow alloy crystals of Ga{sub 1{minus}x}In{sub x}Sb by the conventional Czochralski process. A transparent furnace was used, with hydrogen purging through the chamber during crystal growth. Single crystal seeds up to about 2 to 5 mole% InSb were grown from seeds of 1 to 2 mole% InSb, which were grown from essentially pure GaSb seeds of the [111] direction. Single crystals were grown with InSb rising from about 2 to 6 mole% at the seed ends to about 14 to 23 mole% InSb at the finish ends. A floating-crucible technique that had been effective in reducing segregation in doped crystals, was used to reduce segregation in Czochralski growth of alloy crystals of Ga{sub 1{minus}x}In{sub x}Sb. Crystals close to the targeted composition of 1 mole% InSb were grown. However, difficulties were encountered in reaching higher targeted InSb concentrations. Crystals about 2 mole% were grown when 4 mole% was targeted. It was observed that mixing occurred between the melts rendering the compositions of the melts; and, hence, the resultant crystal unpredictable. The higher density of the growth melt than that of the replenishing melt could have triggered thermosolutal convection to cause such mixing. It was also observed that the floating crucible stuck to the outer crucible when the liquidus temperature of the replenishing melt was significantly higher than that of the growth melt. The homogeneous Ga{sub 1{minus}x}In{sub x}Sb single crystals were grown successfully by a pressure-differential technique. By separating a quartz tube into an upper chamber for crystal growth and a lower chamber for replenishing. The melts were connected by a capillary tube to suppress mixing between them. A constant pressure differential was maintained between the chambers to keep the growth melt up in the growth chamber. The method was first tested with a low temperature alloy Bi{sub ...
Date: February 1, 1998
Creator: Tsaur, S.C.
Partner: UNT Libraries Government Documents Department

Optical constants of Ga{sub 1{minus}x}In{sub x}As{sub y}Sb{sub 1{minus}y} lattice-matched to GaSb(001): Experiment and modeling

Description: The optical constants {epsilon}(E)[={epsilon}{sub 1}(E)+i{epsilon}{sub 2}(E)] of two epitaxial layers of GaInAsSb/GaSb have been measured at 300 K using spectral ellipsometry in the range of 0.35--5.3 eV. The {epsilon}(E) spectra displayed distinct structures associated with critical points (CPs) at E{sub 0} (direct gap), spin-orbit split E{sub 0}+{Delta}{sub 0} component, spin-orbit split (E{sub 1}, E{sub 1}+{Delta}{sub 1}) and (E{sub 0}{prime}, E{sub 0}{prime}+{Delta}{sub 0}{prime}) doublets, as well as E{sub 2}. The experimental data over the entire measured spectral range (after oxide removal) has been fit using the Holder model dielectric function [Phys.Rev.B 56, 4037 (1997)] based on the electronic energy-band structure near these CPs plus excitonic and band-to-band Coulomb enhancement effects at E{sub 0.}, E{sub 0}+{Delta}{sub 0} and the E{sub 1}, E{sub 1}+{Delta}{sub 1} doublet. In addition to evaluating the energies of these various band-to-band CPs, information about the binding energy (R{sub 1}) of the two-dimensional exciton related to the E{sub 1}, E{sub 1}+{Delta}{sub 1} CPs was obtained. The value of R{sub 1} was in good agreement with effective mass/k{sup {rightharpoonup}}{center_dot}p{sup {rightharpoonup}} theory. The ability to evaluate R{sub 1} has important ramifications for recent first-principles band structure calculations which include exciton effects at E{sub 0}, E{sub 1}, and E{sub 2} [M.Rohlfing and S.G.Louie, Phys.Rev.Lett. 81, 2312 (1998) and S. Albrecht et al., Phys.Rev.Lett. 80, 4510 (1998)]. The experimental absorption coefficients in the region of E{sub 0} were in good agreement with values obtained from a linear interpolation of the end point materials. The experimental results were compared to a recent evaluation and fitting (Holden model) of the optical constants of GaSb.
Date: June 1999
Creator: Charache, G. W.; Muñoz, M.; Wei, K.; Pollak, F. H.; Freeouf, J. L. & Wang, C. A.
Partner: UNT Libraries Government Documents Department

Characteristics of GaAsSb single quantum well lasers emitting near 1.3 {micro}m

Description: The authors report data on GaAsSb single quantum well lasers grown on GaAs substrates. Room temperature pulsed emission at 1.275 {micro}m in a 1,250 {micro}m-long device has been observed. Minimum threshold current densities of 535 A/cm{sup 2} were measured in 2000 {micro}m long lasers. The authors also measured internal losses of 2--5 cm{sup {minus}1}, internal quantum efficiencies of 30-38% and characteristic temperature T{sub 0} of 67--77 C. From these parameters a gain constant G{sub 0} of 1,660 cm{sup {minus}1} and a transparency current density J{sub tr} of 134 A/cm{sup 2} were calculated. The results indicate the potential for fabricating 1.3 {micro}m VCSELs from these materials.
Date: February 17, 2000
Creator: SPAHN,OLGA B. & KLEM,JOHN F.
Partner: UNT Libraries Government Documents Department

Thermophotovoltaic Cells on Zinc Diffused Polycrystalline GaSb

Description: For the first time, it has been demonstrated that thermophotovoltaic cells made of polycrystalline GaSb with small grain sizes (down to 100 x 100 {micro}m) have similar characteristics to the best Zinc diffused single crystal GaSb cells with identified device parameters. The grain boundaries in polycrystalline GaSb do not degrade TPV cell parameters, indicating that such material can be used for high-efficiency thermophotovoltaic cells.
Date: May 1, 2000
Creator: Sulima, O.V.; Bett, A.W.; Dutta, P.S.; Ehsani, H. & Gutmann, R.J.
Partner: UNT Libraries Government Documents Department

Bulk single crystal ternary substrates for a thermophotovoltaic energy conversion system

Description: A thermophotovoltaic energy conversion device and a method for making the device are disclosed. The device includes a substrate formed from a bulk single crystal material having a bandgap (E{sub g}) of 0.4 eV < E{sub g} < 0.7 eV and an emitter fabricated on the substrate formed from one of a p-type and an n-type material. Another thermophotovoltaic energy conversion device includes a host substrate formed from a bulk single crystal material and lattice-matched ternary or quaternary III-V semiconductor active layers.
Date: December 31, 1996
Creator: Charache, G.W.; Baldasaro, P.F. & Nichols, G.J.
Partner: UNT Libraries Government Documents Department

A thermophotovoltaic generator for use in a lightweight electric car: Year 1 progress report

Description: In the nine months since the start of this project significant progress toward the completion of the tasks scheduled in the first year has been made and in some cases exceeded. A number of unforeseen problems have been isolated and solved with redesign of components and specification of different materials. This project has been running concurrently with a Phase 1 DOE Green Car SBIR grant to JX Crystals in which WWU is the sub-contractor to do burner design, construction and testing. As a result of this concurrent project, the design of the single burner for the TPV8 which is nearing completion at this time, incorporates the improvements of the Phase 1 Green Car burner. The status of the tasks scheduled for the first nine months of the contract and the current status are shown.
Date: May 1, 1995
Creator: Seal, M.R.
Partner: UNT Libraries Government Documents Department

Thermophotovoltaic (TPV) technology development. Final report, May 15, 1995--December 1, 1995

Description: This program information release (PIR) summarizes work performed under Task Order Contract SF17787, Task Order 18: Thermophotovoltaic Technology Development, sponsored by the U.S. Department of Energy. The period of performance was 15 May 1995 to 1 December 1995. Under this task order, a system model for a thermophotovoltaic (MV) converter was implemented and used to compare a conceptual design for an advanced quaternary III-V cell with integral filter with results previously published for a binary GaSb cell with a freestanding filter. Model results were used to assess the merits of TPV conversion for meeting various levels of space power requirements, including low to medium power isotope applications and high-power reactor applications. A TPV cell development program was initiated to determine the feasibility of fabricating quaternary III-V cells by molecular beam epitaxy. Lastly, a conceptual design was completed for a low-cost demonstration system to test the performance of TPV converters at a multi-cell, sub-system level. The results of these efforts are reported briefly in an executive summary, then in somewhat more detail as a final briefing section in which charts have been reproduced. Additional technical detail is provided in the appendices.
Date: December 11, 1995
Partner: UNT Libraries Government Documents Department

Growth and Characterization of Quantum Dots and Quantum Dots Devices

Description: Quantum dot nanostructures were investigated experimentally and theoretically for potential applications for optoelectronic devices. We have developed the foundation to produce state-of-the-art compound semiconductor nanostructures in a variety of materials: In(AsSb) on GaAs, GaSb on GaAs, and In(AsSb) on GaSb. These materials cover a range of energies from 1.2 to 0.7 eV. We have observed a surfactant effect in InAsSb nanostructure growth. Our theoretical efforts have developed techniques to look at the optical effects induced by many-body Coulombic interactions of carriers in active regions composed of quantum dot nanostructures. Significant deviations of the optical properties from those predicted by the ''atom-like'' quantum dot picture were discovered. Some of these deviations, in particular, those relating to the real part of the optical susceptibility, have since been observed in experiments.
Date: April 1, 2003
Creator: CEDERBERG, JEFFREY G.; BIEFELD, ROBERT M.; SCHNEIDER, H.C. & CHOW, WENG W.
Partner: UNT Libraries Government Documents Department

Bridgman growth and characterization of bulk single crystals of Ga{sub 1{minus}x}In{sub x}Sb for thermophotovoltaic applications

Description: Thermophotovoltaic generation of electricity is attracting renewed attention due to recent advances in low bandgap (0.5--0.7 eV) III-V semiconductors. The use of mixed pseudo-binary compounds allows for the tailoring of the lattice parameter and the bandgap of the material. Conventional deposition techniques (i.e., epitaxy) for producing such ternary or quaternary materials are typically slow and expensive. Production of bulk single crystals of ternary materials, for example Ga{sub 1{minus}x}In{sub x}Sb, is expected to dramatically reduce such material costs. Bulk single crystals of Ga{sub 1{minus}x}In{sub x}Sb have been prepared using a Bridgman technique in a two-zone furnace. These crystals are 19 mm in diameter by approximately 50 mm long and were produced using seeds of the same diameter. The effects of growth rate and starting materials on the composition and quality of these crystals will be discussed and compared with other attempts to produce single crystals of this material.
Date: December 1, 1997
Creator: Boyer, J.R. & Haines, W.T.
Partner: UNT Libraries Government Documents Department

A Simple Single Step diffusion and Emitter Etching Process for High Efficiency Gallium Antimonide Thermophotovoltaic Devices

Description: A single step diffusion followed by precise etching of the diffused layer has been developed to obtain a diffusion profile appropriate for high efficiency GaSb thermophotovoltaic cells. The junction depth was controlled through monitoring of light current-voltage (I-V) curves (photovoltaic response) during the post diffusion emitter etching process. The measured photoresponses (prior to device fabrication) have been correlated with the quantum efficiencies and the open circuit voltages in the fabricated devices. An optimum junction depth for obtaining highest quantum efficiency and open circuit voltage is presented based on diffusion lengths (or monitoring carrier lifetimes), carrier mobility and typical diffused impurity profile in GaSb.
Date: August 29, 2003
Creator: Rajagopalan, G.; Reddy, N.S.; Ehsani, E.; Bhat, I.B.; Dutta, P.S.; Gutmann, R.J. et al.
Partner: UNT Libraries Government Documents Department

Microstructural evaluation of Sb-adjusted Al{sub 0.5}Ga{sub 0.5}As{sub 1{minus}y}Sb{sub y} buffer layer systems for IR applications

Description: The authors report on a transmission electron microscopy (TEM) study of Sb-adjusted quaternary Al{sub 0.5}Ga{sub 0.5}As{sub 1{minus}y}Sb{sub y} buffer-layers grown on <001> GaAs substrates. A series of structures were grown by MBE at 470 C that utilize a multilayer grading scheme in which the Sb content of Al{sub 0.5}Ga{sub 0.5}As{sub 1{minus}y}Sb{sub y} buffer-layers grown on <001> GaAs substrates. A series of structures were grown by MBe at 470 C that utilize a multilayer grading scheme in which the Sb content of Al{sub 0.5}Ga{sub 0.5}As{sub 1{minus}y}Sb{sub y} is successively increased in a series of 125 nm thick layers. Post growth analysis using conventional bright field and weak beam dark field imaging of these buffer layers in cross-section reveals that the interface misfit dislocations are primarily of the 60{degree} type and are distributed through out the interfaces of the buffer layer. When optimized, the authors have shown, using plan view and cross-sectional TEM, that this approach can reduce the threading defect density to below the detectability limit of TEM (< 10{sup 5}/cm{sup 2}) and preserve growth surface planarity. The Sb-graded approach was used to fabricate two 2.2 {micro}m power converter structures fabricated using InGaAs grown on Sb-based buffer layers on GaAs substrates. A microstructural and electrical characterization was performed on these device structures and the results are contrasted with a sample in which InP was selected as the substrate. Microstructure, defect density and device performance in these not-yet-optimized Sb-based buffer layers compares favorably to equivalent devices fabricated using InP substrates.
Date: June 1, 1998
Creator: Chen, E.; Paine, D.C.; Uppal, P.; Ahearn, J.S.; Nichols, K. & Charache, G.W.
Partner: UNT Libraries Government Documents Department

Bulk crystal growth of antimonide based III-V compounds for thermophotovoltaics applications

Description: In this paper, the bulk growth of crack-free GaInSb and single phase GaInAsSb alloys are presented. A new class of III-V quasi-binary [A{sub III}B{sub V}]{sub 12{minus}x}[C{sub III}D{sub V}]{sub x} semiconductor alloys has been synthesized and bulk crystals grown from the melt for the first time. The present investigation is focused on the quasi-binary alloy (GaSb){sub 1{minus}x}(InAs){sub x} (0 < x < 0.05) due to its importance for thermophotovoltaic applications. The structural properties of this melt-grown quasi-binary alloy are found to be significantly different from the conventional quaternary compound Ga{sub 1{minus}x}In{sub x}As{sub y}Sb{sub 1{minus}y} with composition x = y. Synthesis and growth procedures are discussed. For the growth of ternary alloys, it was demonstrated that forced convection or mixing in the melt during directional solidification of In{sub x}Ga{sub 1{minus}x}Sb (0 < x < 0.1) significantly reduces cracks in the crystals.
Date: October 1, 1998
Creator: Dutta, P.S.; Ostrogorsky, A.G. & Gutmann, R.J.
Partner: UNT Libraries Government Documents Department