Description: Conventional transmission electron microscopy (TEM) has been an invaluable tool for verifjhg and developing dislocation theories since the first direct observations of dislocations were made using a TEM in the 1950s. Several useful techniques and technological advancements have been made since, helping fbrther the advancement of dislocation knowledge. The present paper concerns two studies of dislocations in copper made by coupling several of these techniques, specifically weak beam, in situ straining, and stereo TEM. Stereo-TEM coupled with in situ straining TEM was used for tracking 3D dislocation motion and interactions in low dislocation density copper foils. A mechanism by which dislocations in a pileup bypass a dislocation node is observed and discussed. Weak beam TEM is used in conjunction with stereo-TEM to analyze the dislocation content of a dense dislocation wall (DDW).
Date: January 1, 2002
Creator: McCabe, R. J. (Rodney J.); Misra, A. (Amit) & Mitchell, T. E. (Terence E.)
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