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Standard X-ray Diffraction Powder Patterns: Section 10. Data for 84 Substances

Description: From Introduction: "This report presents information for 84 compounds (47 experimental and 37 calculated patterns), and is the twentieth of the series of "Standard X-ray Diffraction Powder Patterns."
Date: November 1972
Creator: Swanson, Howard E.; McMurdie, Howard F.; Morris, Marlene C.; Evans, Eloise H. & Paretzkin, Boris
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns: Section 12. Data for 57 Substances

Description: From Introduction: "This report presents information for 57 compounds (25 experimental and 32 calculated patterns), and is the two-second of the series of "Standard x-ray Diffraction Powder Patterns."
Date: February 1975
Creator: McMurdie, Howard F.; Morris, Marlene C.; Evans, Eloise H.; Paretzkin, Boris; de Groot, Johan H.; Hubbard, Camden R. et al.
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns: Section 14. Data for 68 substances

Description: From Introduction: "This report presents information for 68 compounds (27 experimental and 41 calculated patterns), and is the twenty-fourth of the series of "Standard x-ray Diffraction Powder Patterns."
Date: September 1977
Creator: Morris, Marlene C.; McMurdie, Howard F.; Evans, Eloise H.; Paretzkin, Boris; de Groot, Johan H.; Newberry, Rainer et al.
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns: Section 18. Data for 58 Substances

Description: From Introduction: "This report presents information for 58 experimental patterns, and is the twenty-eighth of the series of Standard X-ray Diffraction Powder Patterns."
Date: October 1981
Creator: Morris, Marlene C.; McMurdie, Howard F.; Evans, Eloise H.; Paretzkin, Boris; Parker, Harry S.; Panagiotopoulos, Nicolas C. et al.
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns: Section 4. Data for 103 Substances

Description: From Introduction: "This compilation is the fourth section of the series Monograph 25. Included are patterns recommended to replace data on 11 cards now present in the File. The other patterns are for 93 compounds not included in the File. In this group of compounds, 22 patterns are experimental and 71 are calculated."
Date: June 28, 1966
Creator: Swanson, Howard E.; Morris, Marlene C. & Evans, Eloise H.
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns: Section 17. Data for 54 Substances

Description: From Introduction: "This report presents information for 54 experimental patterns, and is the twenty-seventh of the series of Standard X-ray Diffraction Powder Patterns."
Date: October 1980
Creator: Morris, Marlene C.; McMurdie, Howard F.; Evans, Eloise H.; Paretzkin, Boris; Hubbard, Camden R. & Carmel, Simon J.
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns: Section 11. Data for 70 Substances

Description: From Introduction: "This reports presents information for 70 compounds (52 experimental and 18 calculated patterns), and is the twenty-first of the series of "Standard X-ray Diffraction Powder Patterns."
Date: February 1974
Creator: Swanson, Howard E.; McMurdie, Howard F.; Morris, Marlene C.; Evans, Eloise H. & Paretzkin, Boris
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns : Section 16. Data for 86 Substances

Description: From Introduction: "This report presents information for 86 compounds (58 experimental and 28 calculated patterns), and is the twenty-sixth of the series of "Standard X-ray Diffraction Powder Patterns."
Date: October 1979
Creator: Morris, Marlene C.; McMurdie, Howard F.; Evans, Eloise H.; Paretzkin, Boris; de Groot, Johan H.; Hubbard, Camden R. et al.
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns: Section 15. Data for 112 substances

Description: From Introduction: "This report presents information for 112 compounds (54 experimental and 58 calculated patterns), and is the twenty-fifth of the series of "Standard x-ray Diffraction Powder Patterns."
Date: October 1978
Creator: Morris, Marlene C.; McMurdie, Howard F.; Evans, Eloise H.; Paretzkin, Boris; de Groot, Johan H.; Weeks, Brenda S. et al.
Partner: UNT Libraries Government Documents Department

X-Ray Diffraction Data for Aromatic, Hydroaromatic, and Tetrahedral Structures of Carbon

Description: From Abstract: "A brief theoretical introduction of the Debye interference function is given, and an outline is made of the treatment of experimental data so that the experimental interference function can be obtained. This study is part of the investigations of the fundamental structure of coals and cokes by the Federal Bureau of Mines. X-ray diffraction is a very powerful tool in studying structure."
Date: unknown
Creator: Ergun, Sabri; Donaldson, W. F. & Smith, R. W., Jr.
Partner: UNT Libraries Government Documents Department

The Bragg Reflection of Neutrons by a Single Crystal

Description: From cover page: This document has been assigned the above MDDC (Manhattan District Declassification) number, as given in the List of Declassified Documents issued semi-monthly by the Research Division, Manhattan District. In the case of Los Alapnos reports, LADC (Los Alamos Declassification) numbers are listed on the title page if known. This declassified document may differ materially from the original classified document by reason of deletions necessary to accomplish declassification. Hence, this copy of a declassified document does not constitute authority for declassification of classified copies of a similar document which may bear the same title and authors. Reference is made to District Circular Letter (Research Control 47-3) dated 31 October 1946, subject: "Instructions for Use of List of Declassified Documents," which outlines the procedure by means of which declassification of classified copies may be effected. Every effort has been made to reproduce with accuracy of detail the declassified document as certified for declassification. No corrections or changes have been made in the content of the document.
Date: June 14, 1946
Creator: Zinn, Walter H.
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns: Section 1. Data for 46 Substances

Description: Report discussing forty-six standard X-ray diffraction powder patterns. Fourteen are to replace twelve patterns already given in the X-ray Powder Data File, and thirty-four are for substances not previously included. The X-ray Powder Data File is a compilation of diffraction patterns from many sources and is used for the identification of unknown crystalline materials by matching spacing and intensity measurements. The patterns were made with a Geiger counter X-ray diffractometer, using samples of high purity.
Date: March 9, 1962
Creator: Swanson, Howard E.; Morris, M. C.; Stinchfield, Roger P. & Evans, Eloise H.
Partner: UNT Libraries Government Documents Department

Standard X-ray Diffraction Powder Patterns: Section 2. Data for 37 Substances

Description: Report discussing standard X-ray diffraction powder patterns for thirty-seven substances. Eleven are to replace patterns already given in the X-ray Powder Data File issued by the American Society for Testing and Materials, and twenty-six patterns indicated by asterisks are for substances not previously included. The X-ray Powder Data File is a compilation of diffraction patterns from many sources and is used for the identification of unknown crystalline materials by matching spacing and intensity measurements. The patterns were made with a Geiger counter X-ray diffractometer, using samples of high purity.
Date: May 3, 1963
Creator: Swanson, Howard E.; Morris, M. C.; Stinchfield, Roger P. & Evans, Eloise H.
Partner: UNT Libraries Government Documents Department

Diffraction Effects in Neutron Attenuation Measurements

Description: All errors due to diffraction effects in a neutron attenuation experiment are computed. Also a special experiment to measure the forward intensity of diffracted neutrons from lead and copper is described, and the results given. These agree with the theoretical values.
Date: November 1, 1947
Creator: Sewell, D.C. & McMillan, E.M.
Partner: UNT Libraries Government Documents Department

John Pendry: His Contributions to the Development of LEED Surface Crystallography

Description: In this paper we discuss the pivotal role played by Sir John Pendry in the development of Low Energy Electron Diffraction (LEED) during the past three decades; the earliest understanding on the physics of LEED to the development of sophisticated methods for the structural solution of complex surfaces.
Date: October 15, 2007
Creator: Somorjai, Gabor A. & Rous, P. J.
Partner: UNT Libraries Government Documents Department

A comparison of different texture analysis techniques

Description: With the advent of automated techniques for measuring individual crystallographic orientations using electron diffraction, there has been an increase in the use of local orientation measurements for measuring textures in polycrystalline materials. Several studies have focused on the number of single orientation measurements necessary to achieve the statistics of more conventional texture measurement, techniques such as pole figure measurement using x-ray and neutron diffraction. This investigation considers this question but also is extended to consider the nature of the differences between textures measured using individual orientation measurements and those measured using x-ray diffraction.
Date: August 1, 1996
Creator: Wright, S.I. & Kocks, U.F.
Partner: UNT Libraries Government Documents Department

Atomic scale structure of the 5-fold surface of an AlPdMn quasicrystal: A quantitative X-Ray photoelectron diffraction analysis

Description: The atomic scale structure of the 5-fold symmetric surface of an AlPdMn quasicrystal is investigated quantitatively by comparing x-ray photoelectron diffraction (XPD) simulations to experiment. The observed 5-fold symmetry of the diffraction patterns indicates that the surface is quasicrystalline with no hint of a reconstruction from the bulk structure. In analyzing the experimental data, many possible bulk terminations have been tested. Those few that fit best to the data have in common that they contain an Al-rich surface layer followed by a dense mixed Al/Pd/Mn layer. These best terminations, while not identical to each other, are suggested to form terraces coexisting on a real surface. Structural relaxations of the quasicrystal surface are also analyzed: mixing several best-fit terminations gives average best-fit interlayer spacing changes of Dd12 = -0.057 Angstrom, Dd24 = +0.159 Angstrom. These results are in good agreement with a prior structure determination by LEED on a sample that was prepared in a different manner.
Date: February 11, 2004
Creator: Zheng, Jin-Cheng; Huan, C.H.A.; Wee, A.T.S.; Van Hove, M.A.; Fadley, C.S.; Shi, F.J. et al.
Partner: UNT Libraries Government Documents Department

Analysis of formulas used in coupling impedance coaxial-wire measurements for distributed impedances

Description: In this paper we study the validity of coupling impedance bench measurements for distributed impedances, comparing the commonly used log formula to the result obtained applying a modified version of Bethe's theory of diffraction to a long slot in a coaxial beam pipe. The equations found provide a quantitative expression for the influence of the wire thickness used in the measurement of the real and imaginary part of the longitudinal impedance. The precision achievable in an actual measurement is therefore discussed. The method presented has also been applied in the presence of lumped impedances [1].
Date: May 30, 2002
Creator: De Santis, Stefano
Partner: UNT Libraries Government Documents Department

Atomic resolution 3D electron diffraction microscopy

Description: Electron lens aberration is the major barrier limiting the resolution of electron microscopy. Here we describe a novel form of electron microscopy to overcome electron lens aberration. By combining coherent electron diffraction with the oversampling phasing method, we show that the 3D structure of a 2 x 2 x 2 unit cell nano-crystal (framework of LTA [Al12Si12O48]8) can be ab initio determined at the resolution of 1 Angstrom from a series of simulated noisy diffraction pattern projections with rotation angles ranging from -70 degrees to +70 degrees in 5 degrees increments along a single rotation axis. This form of microscopy (which we call 3D electron diffraction microscopy) does not require any reference waves, and can image the 3D structure of nanocrystals, as well as non-crystalline biological and materials science samples, with the resolution limited only by the quality of sample diffraction.
Date: March 1, 2002
Creator: Miao, Jianwei; Ohsuna, Tetsu; Terasaki, Osamu & O'Keefe, Michael A.
Partner: UNT Libraries Government Documents Department

Surprising Coordination Geometry Differences in Ce(IV)- and Pu(IV)-Maltol Complexes

Description: As part of a study to characterize the detailed coordination behavior of Pu(IV), single crystal X-ray diffraction structures have been determined for Pu(IV) and Ce(IV) complexes with the naturally-occurring ligand maltol (3-hydroxy-2-methyl-pyran-4-one) and its derivative bromomaltol (5-bromo-3-hydroxy-2-methyl-pyran-4-one). Although Ce(IV) is generally accepted as a structural analog for Pu(IV), and the maltol complexes of these two metals are isostructural, the corresponding bromomaltol complexes are strikingly different with respect to ligand orientation about the metal ion: All complexes exhibit trigonal dodecahedral coordination geometry but the Ce(IV)-bromomaltol complex displays an uncommon ligand arrangement not mirrored in the Pu(IV) complex, although the two metal species are generally accepted to be structural analogs.
Date: February 12, 2008
Creator: Laboratory, Lawrence Berkeley National; Raymond, Kenneth; Szigethy, Geza; Xu, Jide; Gorden, Anne E.V.; Teat, Simon J. et al.
Partner: UNT Libraries Government Documents Department