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An atomic force microcopy study of the mechanical and electricalproperties of monolayer films of molecules with aromatic end groups

Description: The effect of intermolecular {pi}-{pi} stacking on the electrical and mechanical properties of monolayer films molecules containing aromatic groups was studied using atomic force microscopy. Two types of aromatic molecules, (4-mercaptophenyl) anthrylacetylene (MPAA) and (4-mercaptophenyl)-phenylacetylene (MPPA) were used as model systems with different {pi}-{pi} stacking strength. Monolayer films of these molecules on Au(111) surfaces exhibited conductivities differing by more than one order of magnitude, MPAA being the most conductive and MPPA the least conductive. The response to compressive loads by the AFM tip was also found to be very different for both molecules. In MPAA films distinct molecular conductivity changes are observed upon mechanical perturbation. This effect however was not observed on the MPPA film, where intermolecular {pi}-{pi} interactions are likely weaker.
Date: September 6, 2007
Creator: Fang, Liang; Park, J.Y.; Ma, H.; Jen, A.K.-Y. & Salmeron, M.
Partner: UNT Libraries Government Documents Department

The wetting behavior of NiAl and NiPtAl on polycrystalline alumina

Description: In order to understand the beneficial effect of Pt on the adherence of thermally grown alumina scales, sessile drop experiments were performed to study the wetting of poly-crystalline alumina by nickel-aluminum alloys with or without platinum addition where the amount of Pt ranged from 2.4 to 10 at.%. Subsequent interfacial structure was evaluated using atomic force microscopy. Platinum addition enhances the wettability of NiAl alloys on alumina, reduces the oxide/alloy interface energy and increases the interfacial mass transport rates.
Date: July 1, 2007
Creator: Saiz, Eduardo; Gauffier, Antoine; Saiz, Eduardo; Tomsia, Antoni P. & Hou, Peggy Y.
Partner: UNT Libraries Government Documents Department

Reactivity of Ozone with Solid Potassium Iodide Investigated by Atomic Force Microscopy

Description: The reaction of ozone with the (100) plane of solid potassium iodide (KI) was investigated using atomic force microscopy (AFM). The reaction forming potassium iodate (KIO{sub 3}) initiates at step edges prior to reacting on the flat terraces. Small domains of KIO{sub 3}, initially 3.8 {angstrom} in height are formed on the top of step edges. Following reaction at the step edge, domains of KIO{sub 3} are formed across the terraces. With prolonged exposure to ozone, KIO{sub 3} domains nucleate further growth until the surface is evenly covered with KIO{sub 3} particles that are 4-6 nm in height, at which point the surface is passivated and the reaction terminates.
Date: April 14, 2008
Creator: Mulleregan, Alice; Brown, Matthew A.; Ashby, Paul D.; Ogletree, D. Frank; Salmeron, Miquel & Hemminger, John C.
Partner: UNT Libraries Government Documents Department

Effect of Substrate Support on Dynamic Graphene/Metal Electrical Contacts

Description: This article investigates the stability of dynamic electrical contacts at a graphene/metal interface using atomic force microscopy (AFM), under static conditions with variable normal loads and under sliding conditions with variable speeds.
Date: March 22, 2018
Creator: Lee, Jihyung; Hu, Xiaoli; Voevodin, Andrey A.; Martini, Ashlie & Berman, Diana
Partner: UNT College of Engineering

Probing deviations from traditional colloid filtration theory by atomic forces microscopy.

Description: Colloid transport through saturated media is an integral component of predicting the fate and transport of groundwater contaminants. Developing sound predictive capabilities and establishing effective methodologies for remediation relies heavily on our ability to understand the pertinent physical and chemical mechanisms. Traditionally, colloid transport through saturated media has been described by classical colloid filtration theory (CFT), which predicts an exponential decrease in colloid concentration with travel distance. Furthermore, colloid stability as determined by Derjaguin-Landau-Veney-Overbeek (DLVO) theory predicts permanent attachment of unstable particles in a primary energy minimum. However, recent studies show significant deviations from these traditional theories. Deposition in the secondary energy minimum has been suggested as a mechanism by which observed deviations can occur. This work investigates the existence of the secondary energy minimum as predicted by DLVO theory using direct force measurements obtained by Atomic Forces Microscopy. Interaction energy as a function of separation distance between a colloid and a quartz surface in electrolyte solutions of varying ionic strength are obtained. Preliminary force measurements show promise and necessary modifications to the current experimental methodology have been identified. Stringent surface cleaning procedures and the use of high-purity water for all injectant solutions is necessary for the most accurate and precise measurements. Comparisons between direct physical measurements by Atomic Forces Microscopy with theoretical calculations and existing experimental findings will allow the evaluation of the existence or absence of a secondary energy minimum.
Date: December 1, 2005
Creator: Reno, Marissa Devan
Partner: UNT Libraries Government Documents Department

Heavy-Ion Irradiation of Thulium(III) Oxide Targets Prepared by Polymer-Assisted Deposition

Description: Thulium(III) oxide (Tm{sub 2}O{sub 3}) targets prepared by the polymer-assisted deposition (PAD) method were irradiated by heavy-ion beams to test the method's feasibility for nuclear science applications. Targets were prepared on silicon nitride backings (thickness of 1000 nm, 344 {micro}g/cm{sup 2}) and were irradiated with an {sup 40}Ar beam at laboratory frame energy of {approx}210 MeV (50 particle nA). The root mean squared (RMS) roughness prior to irradiation is 1.1 nm for a {approx}250 nm ({approx}220 {micro}g/cm{sup 2}) Tm{sub 2}O{sub 3} target, and an RMS roughness of 2.0 nm after irradiation was measured by atomic force microscopy (AFM). Scanning electron microscopy of the irradiated target reveals no significant differences in surface homogeneity when compared to imaging prior to irradiation. Target flaking was not observed from monitoring Rutherford scattered particles as a function of time.
Date: September 15, 2008
Creator: Garcia, Mitch A.; Ali, Mazhar N.; Chang, Noel N.; Parsons-Moss, Tashi; Ashby, Paul D.; Gates, Jacklyn M. et al.
Partner: UNT Libraries Government Documents Department

Mechanical and Electrical Properties of CdTe Tetrapods Studied byAtomic Force Microscopy

Description: The mechanical and electrical properties of CdTe tetrapod-shaped nanocrystals have been studied with atomic force microscopy. Tapping mode images of tetrapods deposited on silicon wafers revealed that they contact the surface with the ends of three arms. The length of these arms was found to be 130 {+-} 10 nm. A large fraction of the tetrapods had a shortened vertical arm as a result of fracture during sample preparation. Fracture also occurs when the applied load is a few nanonewtons. Compression experiments with the AFM tip indicate that tetrapods with the shortened vertical arm deform elastically when the applied force was less than 50 nN. Above 90 nN additional fracture events occurred that further shorted the vertical arm. Loads above 130 nN produced irreversible damage to the other arms as well. Current-voltage characteristics of tetrapods deposited on gold indicated semiconducting behavior with a current gap of {approx}2 eV at low loads (<50 nN) and a narrowing to about 1 eV at loads between 60 and 110 nN. Atomic calculation of the deformation suggests that the ends of the tetrapod arms are stuck during compression so that the deformations are due to bending modes. The reduction of the current gap is due to electrostatic effects, rather than strain deformation effects inside the tetrapod.
Date: August 30, 2007
Creator: Fang, Liang; Park, Jeong Young; Cui, Yi; Alivisatos, Paul; Shcrier, Joshua; Lee, Byounghak et al.
Partner: UNT Libraries Government Documents Department

Bacillus atrophaeus Outer Spore Coat Assembly and Ultrastructure

Description: Our previous atomic force microscopy (AFM) studies successfully visualized native Bacillus atrophaeus spore coat ultrastructure and surface morphology. We have shown that the outer spore coat surface is formed by a crystalline array of {approx}11 nm thick rodlets, having a periodicity of {approx}8 nm. We present here further AFM ultrastructural investigations of air-dried and fully hydrated spore surface architecture. In the rodlet layer, planar and point defects, as well as domain boundaries, similar to those described for inorganic and macromolecular crystals, were identified. For several Bacillus species, rodlet structure assembly and architectural variation appear to be a consequence of species-specific nucleation and crystallization mechanisms that regulate the formation of the outer spore coat. We propose a unifying mechanism for nucleation and self-assembly of this crystalline layer on the outer spore coat surface.
Date: November 21, 2005
Creator: Plomp, M; Leighton, T J; Wheeler, K E; Pitesky, M E & Malkin, A J
Partner: UNT Libraries Government Documents Department

Bayesian Estimates of Free Energies from Nonequilibrium Work Data in the Presence of Instrument Noise

Description: The Jarzynski equality and the fluctuation theorem relate equilibrium free energy differences to nonequilibrium measurements of the work. These relations extend to single-molecule experiments that have probed the finite-time thermodynamics of proteins and nucleic acids. The effects of experimental error and instrument noise have not been considered previously. Here, we present a Bayesian formalism for estimating free energy changes from nonequilibrium work measurements that compensates for instrument noise and combines data from multiple driving protocols. We reanalyze a recent set of experiments in which a single RNA hairpin is unfolded and refolded using optical tweezers at three different rates. Interestingly, the fastest and farthest-from-equilibrium measurements contain the least instrumental noise and, therefore, provide a more accurate estimate of the free energies than a few slow, more noisy, near-equilibrium measurements. The methods we propose here will extend the scope of single-molecule experiments; they can be used in the analysis of data from measurements with atomic force microscopy, optical, and magnetic tweezers
Date: July 8, 2008
Creator: Maragakis, Paul; Ritort, Felix; Bustamante, Carlos; Karplus, Martin & Crooks, Gavin E.
Partner: UNT Libraries Government Documents Department

Towards Understanding the Mechanism of PETN Coarsening

Description: The long-term goal is to determine the mechanism of PETN crystallization and coarsening at the solid-vapor interface and to quantify the thermodynamic and kinetic parameters that control those processes. We achieve this goal by investigating the surface evolution of synthetic PETN single crystals using in situ atomic force microscopy (AFM) at various temperatures.
Date: March 23, 2005
Creator: Qiu, R; Overturf, G; Gee, R; Burnham, A; Weeks, B & De Yoreo, J
Partner: UNT Libraries Government Documents Department

Influence of molecular ordering on electrical and friction properties of omega-(trans-4-stilbene)alkylthiol self-assembled monolayers on Au (111)

Description: The electrical and friction properties of omega-(trans-4-stilbene)alkylthiol self-assembled monolayers (SAMs) on Au(111) were investigated using atomic force microscopy (AFM) and near edge x-ray absorption fine structure spectroscopy (NEXAFS). The sample surface was uniformly covered with a molecular film consisting of very small grains. Well-ordered and flat monolayer islands were formed after the sample was heated in nitrogen at 120 oC for 1 h. While lattice resolved AFM images revealed a crystalline phase in the islands, the area between islands showed no order. The islands exhibit substantial reduction (50percent) in friction, supporting the existence of good ordering. NEXAFS measurements revealed an average upright molecular orientation in the film, both before and after heating, with a narrower tilt-angle distribution for the heated fim. Conductance-AFM measurements revealed a two orders of magnitude higher conductivity on the ordered islands than on the disordered phase. We propose that the conductance enhancement is a result of a better pi-pi stacking between the trans-stilbene molecular units as a result of improved ordering in islands.
Date: April 21, 2010
Creator: Qi, Yabing; Liu, Xiaosong; Hendriksen, B.L.M.; Navarro, V.; Park, Jeong Y.; Ratera, Imma et al.
Partner: UNT Libraries Government Documents Department

Sensing Current and Forces with SPM

Description: Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces during STM and the detection of currents during AFM can give valuable additional information of the nanoscale material properties.
Date: July 2, 2010
Creator: Park, Jeong Y.; Maier, Sabine; Hendriksen, Bas & Salmeron, Miquel
Partner: UNT Libraries Government Documents Department

Reversible wetting of NaCl nanoparticles at relative humidities below deliquescence observed by environmental non-contact AFM

Description: The behavior of NaCl nanoparticles as a function of relative humidity (RH) was characterized by depositing particles on a prepared hydrophobic surface and measuring their height via non-contact environmental atomic force microscopy (AFM). Non-contact AFM allows greater sensitivity to changes in the size of particles than does contact AFM or scanning electron microscopy, and greater sensitivity to changes in shape than do mass-based techniques. Crystalline cubic NaCl nanoparticles with sides of 35 to 150 nm were found to reversibly take up water with increasing RH, and to form a liquid-like surface layer of thickness 2 to 4 nm at humidities well below the deliquescence point of 75.0% at 20°C. Measurable uptake begins at 70% RH. The maximum thickness of the layer increases with increasing RH for a given particle size and, for a given RH, increases with increasing particle size over the range studied. The liquid-like behavior of the layer is indicated by a reversible “rounding” at the tops of the particles, where the ratio of particle height to radius of curvature increases from zero (flat top) at 68% RH to 0.7 at 74% RH. These observations suggest that a reorganization of mass occurs on the solid NaCl nanoparticle, and hence that the behavior of NaCl aerosol nanoparticles at RH between 70 and 75% RH is more complex than an abrupt first-order phase transition. Theoretical treatments of the phase transition should therefore account for both the presence of a liquid-like layer prior to deliquescence, and the RH-dependent thickness of the layer.
Date: December 14, 2009
Creator: Bruzewicz, D.A.; Lewis, E.; Ocko, B. M.; McGraw, R. L. & Schwartz, S. E.
Partner: UNT Libraries Government Documents Department

Replicated mask surface roughness effects on EUV lithographic pattering and line edge roughness

Description: To quantify the roughness contributions to speckle, a programmed roughness substrate was fabricated with a number of areas having different roughness magnitudes. The substrate was then multilayer coated. Atomic force microscopy (AFM) surface maps were collected before and after multilayer deposition. At-wavelength reflectance and total integrated scattering measurements were also completed. Angle resolved scattering based power spectral densities are directly compared to the AFM based power spectra. We show that AFM overpredicts the roughness in the picometer measurements range. The mask was then imaged at-wavelength for the direct characterization of the aerial image speckle using the SEMATECH Berkeley Actinic Inspection Tool (AIT). Modeling was used to test the effectiveness of the different metrologies in predicting the measured aerial-image speckle. AIT measured contrast values are 25% or more than the calculated image contrast values obtained using the measured rms roughness input. The extent to which the various metrologies can be utilized for specifying tolerable roughness limits on EUV masks is still to be determined. Further modeling and measurements are being planned.
Date: March 11, 2011
Creator: George, Simi A.; Naulleau, Patrick P.; Gullikson, Eric M.; Mochi, Iacopo; Salmassi, Farhad; Goldberg, Kenneth A. et al.
Partner: UNT Libraries Government Documents Department

Influence of Reaction with XeF2 on Surface Adhesion of Al and Al2O3 Surfaces

Description: The change of surface adhesion after fluorination of Al and Al{sub 2}O{sub 3} surfaces using XeF{sub 2} was investigated with atomic force microscopy. The chemical interaction between XeF{sub 2} and Al and Al{sub 2}O{sub 3} surfaces was studied by in situ x-ray photoelectron spectroscopy. Fresh Al and Al{sub 2}O{sub 3} surfaces were obtained by etching top silicon layers of Si/Al and Si/Al{sub 2}O{sub 3} with XeF{sub 2}. The surface adhesion and chemical composition were measured as a function of time after the exposure to air or annealing (at 200 C under vauum). The correlation between the adhesion force increase and presence of AlF{sub 3} on the surface was revealed.
Date: July 28, 2008
Creator: Zhang, Tianfu; Park, Jeong Y.; Huang, Wenyu & Somorjai, Gabor A.
Partner: UNT Libraries Government Documents Department

Nanostructured Arrays Formed by Finely Focused Ion Beams

Description: Amorphous, polycrystalline, and single crystal nanometer dimension particles can be formed in a variety of substrates by ion implantation and subsequent annealing. Such composite colloidal materials exhibit unique optical properties that could be useful in optical devices, switches, and waveguides. However colloids formed by blanket implantation are not uniform in size due to the nonuniform density of the implant, resulting in diminution of the size dependent optical properties. The object of the present work is to form more uniform size particles arranged in a 2-dimensional lattice by using a finely focused ion beam to implant identical ion doses only into nanometer size regions located at each point of a rectangular lattice. Initial work is being done with a 30 keV Ga beam implanted into Si. Results of particle formation as a function of implant conditions as analyzed by Rutherford backscattering, x-ray analysis, atomic force microscopy, and both scanning and transmission electron microscopy will be presented and discussed.
Date: November 30, 1998
Creator: Budai, J.D.; Datsos, P.G.; Feldman, L.C.; Heinig, K.-H.; Meldrum, A.; Strobel, M. et al.
Partner: UNT Libraries Government Documents Department

Growth and Structure of Metallic Barrier Layer and Interconnect Films I: Experiments

Description: We present experimented results directed at understanding the growth and structure of metallic barrier layer and interconnect films. Numerical simulation results associated with this experimental work are presented in an accompanying paper in these proceedings. Here, thin films of Al, Ti, Cu and Ta have been grown by magnetron sputtering onto oxidized Si substrates. Using a specially-constructed substrate holder, the orientation of the substrate with respect to the growth direction was varied from horizontal to vertical. Films were grown at both low and high argon pressure; in the case of Ta, the cathode power was varied as well. The film structure and in particular the surface roughness was measured by X-ray reflectance and also by atomic force microscopy. We find that the surface roughness increases markedly with orientation angle in the case of Ta and Cu films, and in Ti films grown at high argon pressure. At low pressure, however, the Ti film surface roughness remains constant for all substrate orientations. No variation in roughness with either orientation angle or argon pressure was observed in the Al films. These results suggest that, under certain circumstances, shadowing effects and/or grain orientation (i.e., texture) competition during growth can give rise to lower density, more porous (and thus more rough) films, particularly at large orientation angles, as on sidewalls in sub-micron trenches.
Date: April 5, 1999
Creator: Baumann, F.H.; Gilmer, G.H.; O'Sullivan, P.L.; Sapjeta, J.; Torre, J.D. & Windt, D.L.
Partner: UNT Libraries Government Documents Department

MATERIALS WITH COMPLEX ELECTRONIC/ATOMIC STRUCTURES

Description: We explored both experimentally and theoretically the behavior of materials at stresses close to their theoretical strength. This involves the preparation of ultra fine scale structures by a variety of fabrication methods. In the past year work has concentrated on wire drawing of in situ composites such as Cu-Ag and Cu-Nb. Materials were also fabricated by melting alloys in glass and drawing them into filaments at high temperatures by a method known as Taylor wire technique. Cu-Ag microwires have been drawn by this technique to produce wires 10 {micro}m in diameter that consist of nanoscale grains of supersaturated solid solution. Organogels formed from novel organic gelators containing cholesterol tethered to squaraine dyes or trans-stilbene derivatives have been studied from several different perspectives. The two types of molecules are active toward several organic liquids, gelling in some cases at w/w percentages as low as 0.1. While relatively robust, acroscopically dry gels are formed in several cases, studies with a variety of probes indicate that much of the solvent may exist in domains that are essentially liquid-like in terms of their microenvironment. The gels have been imaged by atomic force microscopy and conventional and fluorescence microscopy, monitoring both the gelator fluorescence in the case of the stilbene-cholesterol gels and, the fluorescence of solutes dissolved in the solvent. Remarkably, our findings show that several of the gels are composed of similarly appearing fibrous structures visible at the nano-, micro-, and macroscale.
Date: September 1, 2000
Creator: PARKIN, D. M.; CHEN, L. & AL, ET
Partner: UNT Libraries Government Documents Department

Orthoclase surface structure dissolution measured in situ by x-ray reflectivity and atomic force microscopy.

Description: Orthoclase (001) surface topography and interface structure were measured during dissolution by using in situ atomic force microscopy (AFM) and synchrotrons X-ray reflectivity at pH 1.1-12.9 and T = 25-84 C. Terrace roughening at low pH and step motion at high pH were the main phenomena observed, and dissolution rates were measured precisely. Contrasting dissolution mechanisms are inferred for low- and high-pH conditions. These observations clarify differences in alkali feldspar dissolution mechanisms as a function of pH, demonstrate a new in situ method for measuring face-specific dissolution rates on single crystals, and improve the fundamental basis for understanding alkali feldspar weathering processes.
Date: November 28, 2000
Creator: Sturchio, N. C.; Fenter, P.; Cheng, L. & Teng, H.
Partner: UNT Libraries Government Documents Department

Mechanistic study of dielectric chemical mechanical polishing by spectral and scaling analysis of atomic force microscope images

Description: Thermal oxide and PETEOS oxide surfaces, polished on an IPEC 472 with different combinations of polish pad, slurry, and polishing conditions, were studied with ex situ atomic force microscopy. The post polish surfaces were analyzed qualitatively by visual inspection and quantitatively by spectral and scaling analyses. Spectral and scaling analyses gave consistent interpretations of morphology evolution. Polishing with either a fixed abrasive pad or alumina-based slurry occurred via a mechanism for which asperities are removed and recesses are filled. A sputtering-type mechanism may contribute to material removal when polishing with silica- or ceria-based slurries.
Date: December 22, 1999
Creator: Verhoff, M.L.
Partner: UNT Libraries Government Documents Department